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M. Schuster

Observed names: M Schuster, M. SCHUSTER, Manfred R. Schuster, Manfred Schuster, SCHUSTER, MANFRED
Institution: Siemens (Germany)
OpenAlex ID: A5087617508
Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry
1998 · T. Metzger, R. Höpler, et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 600
Inverse geometry for grating-based x-ray phase-contrast imaging
2009 · Tilman Donath, Michael Chabior, et al. · Journal of Applied Physics · 181
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Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data
1999 · M Schuster, P O Gervais, et al. · Journal of Physics D Applied Physics · 137
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Parallel-beam coupling into channel-cut monochromators using curved graded multilayers
1995 · M Schuster, H Gobel · Journal of Physics D Applied Physics · 137
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High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source
2007 · Martin Engelhardt, Joachim Baumann, et al. · Applied Physics Letters · 131
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Determination of the dispersive correction f'(E) to the atomic form factor from X-ray reflection
1992 · F. Stanglmeier, B. Lengeler, et al. · Acta Crystallographica Section A Foundations of Crystallography · 92
The fractional Talbot effect in differential x‐ray phase‐contrast imaging for extended and polychromatic x‐ray sources
2008 · M. ENGELHARDT, C. KOTTLER, et al. · Journal of Microscopy · 86
Growth of high quality InGaAsN heterostructures and their laser application
2001 · A.Yu. Egorov, D. Bernklau, et al. · Journal of Crystal Growth · 77
Beam hardening effects in grating‐based x‐ray phase‐contrast imaging
2011 · Michael Chabior, Tilman Donath, et al. · Medical Physics · 65
Signal-to-noise ratio in x ray dark-field imaging using a grating interferometer
2011 · Michael Chabior, Tilman Donath, et al. · Journal of Applied Physics · 57
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Surface analysis by spectroscopy of Auger electrons induced by surface channeled ions
1983 · M. Schuster, C. Varelas · Surface Science · 56
Quantitative X-ray fluorescence analysis of boron in thin films of borophosphosilicate glasses
1988 · M. Schuster, L. Müller, et al. · Thin Solid Films · 47
A total reflection X-ray fluorescence spectrometer with monochromatic excitation
1991 · M. Schuster · Spectrochimica Acta Part B Atomic Spectroscopy · 42
Laterally graded multilayer optics for x-ray analysis
1999 · Manfred R. Schuster, H. Goebel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 40
Optimized growth of BGaAs by molecular beam epitaxy
2004 · M.E Groenert, R Averbeck, et al. · Journal of Crystal Growth · 39
Inspection of refractive x-ray lenses using high-resolution differential phase contrast imaging with a microfocus x-ray source
2007 · Martin Engelhardt, Joachim Baumann, et al. · Review of Scientific Instruments · 29
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Application of Graded Multilayer Optics in X-Ray Diffraction
1995 · M. Schuster, H. Göbel · Advances in X-ray Analysis · 26
Coherent X-Ray Scattering Phenomenon in Highly Disordered Epitaxial AlN Films
1997 · T. Metzger, R. Höpler, et al. · physica status solidi (a) · 22
Surface analysis of crystals by surface channeling
1988 · R. Pfandzelter, M. Schuster · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 15
Improved Graded Multilayer Mirrors for Xrd Applications
2000 · C. Michaelsen, Paulo Ricardo, et al. · 14
Micro-focus double-crystal X-ray diffractometry on IIl-V heterostructures grown by selective-area epitaxy
1995 · A Iberl, M Schuster, et al. · Journal of Physics D Applied Physics · 14
High-resolution X-ray diffraction and X-ray standing wave analyses of (AlAs)m(GaAs)nshort-period superlattices
1995 · M Schuster, A Lessmann, et al. · Journal of Physics D Applied Physics · 11
Grating-based phase-contrast computed tomography of thick samples
2012 · Michael Chabior, Manfred Schuster, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 9
Influence of the grating profiles on the image quality in grating-based x-ray imaging
2012 · Michael Chabior, Manfred Schuster, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 9
Photodiodes as detectors with high dynamical range for X-ray reflectivity measurements
1991 · Ch. Storb, U. Dedek, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 9
Works count: 44
Citation count: 2,012
H-index: 18
I10-index: 22
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