Application of Graded Multilayer Optics in X-Ray Diffraction
Year: 1995
Type: article
Source: Advances in X-ray Analysis
Authors: M. Schuster, H. Göbel
Institution: Siemens (Germany)
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Funder: Fraunhofer-Gesellschaft
OpenAlex ID: W2486947628