Author

Tieer Gu

OpenAlex ID: A5103381985
1992 · David L. Pappas, Katherine L. Saenger, et al. · Journal of Applied Physics · 337
1996 · Je-Hsiung Lan, Jerzy Kanicki, et al. · Journal of Electronic Materials · 57
1996 · Young Hee Byun, W. Den Boer, et al. · IEEE Transactions on Electron Devices · 16
1994 · Tieer Gu, R. A. Ditizio, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 13
1998 · Willem den Boer, Steven Aggas, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
1993 · John F. Rembetski, Y D. Chan, et al. · Japanese Journal of Applied Physics · 6
1993 · Tieer Gu, R. A. Ditizio, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 4
1995 · Tieer Gu, O. O. Awadelkarim, et al. · Journal of The Electrochemical Society · 1
2002 · Young Byun, W. den Beer, et al. · Conference digest
1998 · Tieer Gu, Yiwei Lu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 11
Citation count: 443
H-index: 6
I10-index: 4
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