Author

DongHo Cha

Observed names: Dong-Ho Cha, Dong-ho Cha, Dongho Cha

Observed institutions: Pohang University of Science and Technology, University of California, Los Angeles, Samsung (South Korea), Samsung Electronics (South Korea)

OpenAlex ID: A5109951817

Ge/Si Self-Assembled Quantum Dots and Their Optoelectronic Device Applications

2007 · Kang L. Wang, Dongho Cha, et al. · Proceedings of the IEEE · 163

Polymer Optical Waveguide Switch Using Thermo-Optic Total-Internal-Reflection and Strain-Effect

2009 · SeongKu Kim, DongHo Cha, et al. · IEEE Photonics Technology Letters · 10

Metal-slotted polymer optical waveguide device

2007 · Seong-Ku Kim, Yu-Chueh Hung, et al. · Applied Physics Letters · 9

Intersubband absorption in p-type Si1−xGex quantum dots on pre-patterned Si substrates made by a diblock copolymer process

2007 · Dongho Cha, Masaaki Ogawa, et al. · Journal of Crystal Growth · 8

Structural characterization of a Mo/Si multilayer reflector by means of x-ray diffraction measurements

1997 · Dong-Eon Kim, Dong-Ho Cha, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 6

Comparison of Leak Sensors for Detection Sensitivity in a Vacuum Chamber: Self-Plasma Optical Emission Spectroscopy and Residual Gas Analyzer

2025 · Chulhee Cho, Sijun Kim, et al. · IEEE Sensors Journal · 3

Evaluation of phase-edge phase-shifting mask for sub-0.18-μm gate patterns in logic devices

1998 · DongHo Cha, Jongwook Kye, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

Nano-patterned Growth of Ge Quantum Dots for Infrared Detector Applications

2005 · Christopher Chen, Dongho Cha, et al. · MRS Proceedings · 1

Characterization of pattern-placement error for sub-40-nm memory devices

2009 · Jangho Shin, Dongho Cha, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Dosage dependence of Ge quantum dots grown on carbon-implanted Si substrates

2006 · Masaaki Ogawa, Dong-ho Cha, et al. · Journal of Crystal Growth

Validation of ArF Chromeless PSM in the Sub-100 nm Node DRAM Cell

2002 · Ju-Hyung Lee, Dong-Hoon Chung, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Defect inspection and printability of deep-UV halftone phase-shifting mask

1997 · Hyoungjoon Kim, Jin Hong, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Structural analysis of multilayered x-ray mirrors by x-ray diffraction

1995 · Dong-Eon Kim, DongHo Cha · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

X - ray Optical Characteristics of Layered Synthetic Materials and their Applications

1995 · Dong-Eon Kim, DongHo Cha, et al. · 한국진공학회 학술발표회초록집

Works count: 14

Citation count: 202

H-index: 5

I10-index: 2