Get started
Author

H. Inada

Observed names: H Inada, Hiroshi Inada Hiroshi Inada
OpenAlex ID: A5110015253
Recent advances in platinum monolayer electrocatalysts for oxygen reduction reaction: Scale-up synthesis, structure and activity of Pt shells on Pd cores
2009 · K. Sasaki, J.X. Wang, et al. · Electrochimica Acta · 267
Imaging single atoms using secondary electrons with an aberration-corrected electron microscope
2009 · Y. Zhu, H. Inada, et al. · Nature Materials · 180
Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms
2010 · H. Inada, D. Su, et al. · Ultramicroscopy · 86
PDF
Origin of Phonon Glass–Electron Crystal Behavior in Thermoelectric Layered Cobaltate
2013 · Lijun Wu, Qingping Meng, et al. · Advanced Functional Materials · 64
Surface determination through atomically resolved secondary-electron imaging
2015 · J. Ciston, H. G. Brown, et al. · Nature Communications · 58
PDF
Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM
2009 · H. Inada, L. Wu, et al. · Journal of Electron Microscopy · 51
Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope
2013 · J.S. Wu, A.M. Kim, et al. · Ultramicroscopy · 48
In Situ Surface Characterization of SrTiO3 (100) Substrates for Well-defined SrTiO3 and YBa2Cu3O7-x Thin Film Growth
1997 · Takao Nakamura, Hiroshi Inada Hiroshi Inada, et al. · Japanese Journal of Applied Physics · 11
PDF
Application of 80-200 kV aberration corrected dedicated STEM with cold FEG
2010 · M Konno, Y Suzuki, et al. · Journal of Physics Conference Series · 7
PDF
Strain Measurements Using Nano-Beam Diffraction on a FE-STEM
2007 · C Vartuli, K Jarausch, et al. · Microscopy and Microanalysis · 6
Secondary Electron Microscopy in STEM
2014 · H. Inada, Y. Zhu · IMPERIAL COLLEGE PRESS eBooks · 5
Evaluation of Environmental Imaging for 200kV Field Emission Cs-corrected Analytical Scanning and Transmission Electron Microscope for Multi-User Facilities
2017 · H. Inada, T. Yotsuji, et al. · Microscopy and Microanalysis · 4
PDF
Interfacial reconstruction and superconductivity in cuprate–manganite multilayers of YBa2Cu3O7−δand Pr0.68Ca0.32MnO3
2012 · J Norpoth, D Su, et al. · New Journal of Physics · 4
PDF
The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
2008 · H Inada, Y Zhu, et al. · Microscopy and Microanalysis · 4
Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage
2008 · H Inada, J Wall, et al. · Microscopy and Microanalysis · 3
Simultaneous Operation of Superconducting Field Effect Transistors
1997 · Takao Nakamura, Hiroshi Inada Hiroshi Inada, et al. · Japanese Journal of Applied Physics · 3
PDF
Environmental Real Time Imaging with 200kV FE Aberration-corrected Analytical Scanning Transmission Electron Microscope (ESTEM) System with an Open Window Gas Injection
2018 · H. Inada, H. Kikuchi, et al. · Microscopy and Microanalysis · 2
PDF
Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
2016 · H. Inada, Y. Taniguchi, et al. · Microscopy and Microanalysis · 2
PDF
The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis
2013 · K. Tamura, R. Namekawa, et al. · Microscopy and Microanalysis · 2
PDF
High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope
2010 · M Konno, Y Suzuki, et al. · Microscopy and Microanalysis · 2
PDF
Mixing Real and Reciprocal Space
2009 · R. D. Twesten, P. J. Thomas, et al. · Springer eBooks · 2
In Situ Surface Characterization of YBa2Cu3O7-x Thin Films Grown by Pulsed Laser Deposition
1996 · Takao Nakamura, Hiroshi Inada Hiroshi Inada, et al. · Japanese Journal of Applied Physics · 2
STEM and TEM: Disparate Magnification Definitions and a Way Out.
2017 · E. Voelkl, David Hoyle, et al. · Microscopy and Microanalysis · 1
PDF
Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope
2011 · H Inada, K Tamura, et al. · Microscopy and Microanalysis · 1
PDF
A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System
2007 · T Yaguchi, M Konno, et al. · Microscopy and Microanalysis · 1
Works count: 46
Citation count: 816
H-index: 8
I10-index: 8
Year
Topic
Type