Work

Strain Measurements Using Nano-Beam Diffraction on a FE-STEM

Year: 2007

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927607077999

Authors: C Vartuli, K Jarausch, H Inada, R Tsuneta, D Dingley, E Marley

Institutions: Texas Instruments (United States), Hitachi High-Tech (Japan), Hitachi (Japan)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2115657964

FWCI: 0.079

Cites:

Cited by: 6

Related to: 10