Author

Walter M. Duncan

Observed names: Duncan, Walter M., W. Duncan, W. M. DUNCAN, W. M. Duncan, W.M. DUNCAN, W.M. Duncan, Walter Duncan, Walter M Duncan

Observed institutions: AT&T (United States), National Institute of Standards and Technology, United States Government Publishing Office, North Carolina State University, Emory University, The University of Texas at Dallas, RTI International, Yale University, Engineering Laboratory, Texas Instruments (United States)

OpenAlex ID: A5110057729

Emerging digital micromirror device (DMD) applications

2003 · Dana Dudley, Walter M. Duncan, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 508

Spatial quantization in GaAs–AlGaAs multiple quantum dots

1986 · M. A. Reed, R. T. Bate, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 248

Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor

1997 · Hal Edwards, Larry Taylor, et al. · Journal of Applied Physics · 179

Visible and ultraviolet Raman scattering studies of Si1−xGex alloys

2000 · M. Holtz, W. M. Duncan, et al. · Journal of Applied Physics · 104

Insitu spectral ellipsometry for real-time measurement and control

1993 · Walter M. Duncan, Steven A. Henck · Applied Surface Science · 69

Atomic layer epitaxy of GaInP ordered alloy

1990 · B. T. McDermott, K. G. Reid, et al. · Applied Physics Letters · 67

A comparison of techniques for nondestructive composition measurements in CdZnTe substrates

1995 · S. P. Tobin, J. P. Tower, et al. · Journal of Electronic Materials · 62

Complex Airy analysis of photoreflectance spectra for III-V semiconductors

1994 · J. P. Estrera, W. M. Duncan, et al. · Physical review. B, Condensed matter · 53

Phonon mode study of near-lattice-matched InxGa1−xAs using micro-Raman spectroscopy

1992 · J. P. Estrera, P. D. Stevens, et al. · Applied Physics Letters · 49

DLP technolgy: applications in optical networking

2001 · Lars A. Yoder, Walter M. Duncan, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 41

Photoluminescence and x-ray properties of heteroepitaxial gallium arsenide on silicon

1986 · W. M. Duncan, J. W. Lee, et al. · Journal of Applied Physics · 40

GaAs/AlGaAs heterojunction bipolar transistors for integrated circuit applications

1982 · W.V. McLevige, H.T. Yuan, et al. · IEEE Electron Device Letters · 33

In situ spectral ellipsometry for real-time thickness measurement: Etching multilayer stacks

1993 · Steven A. Henck, Walter M. Duncan, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 32

Quantitative resonant tunneling spectroscopy: Current-voltage characteristics of precisely characterized resonant tunneling diodes

1989 · M. A. Reed, W. R. Frensley, et al. · Applied Physics Letters · 32

Self‐Compensation in Rapid Thermal Annealed Silicon‐Implanted Gallium Arsenide

1985 · S. K. Tiku, W. M. Duncan · Journal of The Electrochemical Society · 32

Dynamic optical filtering in DWDM systems using the DMD

2002 · Walter M Duncan, Terry Bartlett, et al. · Solid-State Electronics · 26

Raman studies of heavily carbon doped GaAs

1999 · M. Seon, M. Holtz, et al. · Journal of Applied Physics · 26

Ultraviolet Raman stress mapping in silicon

1999 · M. Holtz, J. C. Carty, et al. · Applied Physics Letters · 26

Compensation in n-type GaAs resulting from nitrogen ion implantation

1984 · W. M. Duncan, S. Matteson · Journal of Applied Physics · 26

High-speed spectral ellipsometry for in situ diagnostics and process control

1994 · W. M. Duncan, S. A. Henck, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 20

Photoluminescence and microstructural properties of high-temperature annealed buried oxide silicon-on-insulator

1987 · W. M. Duncan, P.-H. Chang, et al. · Applied Physics Letters · 19

Molecular-beam epitaxy flux transient monitoring and correction using in situ reflection mass spectrometry

1993 · F. G. Celii, Y. C. Kao, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 18

Ordered GaInP by atomic layer epitaxy

1991 · B.T. McDermott, N.A. El-Masry, et al. · Journal of Crystal Growth · 17

Near-field scanning optical microscope for microelectronic materials and devices

1996 · Walter M. Duncan · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 16

Photoluminescence from submicron CaF2:Nd films grown epitaxially on Si(111) and Al(111)/Si(111)

1992 · C. C. Cho, W. M. Duncan, et al. · Applied Physics Letters · 16

Works count: 103

Citation count: 2,119

H-index: 20

I10-index: 40