Author

Katsuyuki Ohnishi

Observed names: K Ohnishi, K. Ohnishi, K.. Ohnishi, KATSUYUKI OHNISHI, Katsuyuki OHNISHI
Institution: Tachikawa Hospital
OpenAlex ID: A5110075575
2003 · S. Tsujikawa, T. Mine, et al. · IEEE International Reliability Physics Symposium proceedings · 78
1995 · HIDENORI KIYOCHI, ATSUMI ONO, et al. · Transplantation · 30
2002 · T. Uchino, T. Shiba, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 14
2003 · R. Tsuchiya, K. Ohnishi, et al. · Symposium on VLSI Technology · 13
1996 · T. Shiba, T. Uchino, et al. · IEEE Transactions on Electron Devices · 9
2007 · M.. Miyamoto, N.. Sugii, et al. · IEEE Transactions on Electron Devices · 6
2002 · K. Ohnishi, N. Yamamoto, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 6
1995 · HIDENORI KIYOCHI, ATSUMI ONO, et al. · Transplantation · 5
1987 · Fumio Harashima, Seiji Kondo, et al. · IEEE Industry Applications Society Annual Meeting (IAS) · 5
2000 · A Sugimura, K Ohnishi, et al. · Thin Solid Films · 3
1999 · K. Izumi, K. Ohnishi, et al. · IEEE Transactions on Consumer Electronics · 3
2008 · N. Nakanishi, S. Kudo, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 2
2002 · K. Ohnishi, R. Tsuchiya, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 2
2017 · S. Usuda, K. Yu, et al. · International Journal of Oral and Maxillofacial Surgery · 1
2006 · M. Miyamoto, N. Sugii, et al. · 2006 International SiGe Technology and Device Meeting · 1
2003 · K. Izumi, K. Ohnishi, et al. · International Conference on Consumer Electronics · 1
2002 · D. Hisamoto, K. Umeda, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 1
2003 · T. Onai, S. Tsujikawa, et al. · Technical digest - International Electron Devices Meeting/Technical digest
Works count: 40
Citation count: 242
H-index: 8
I10-index: 5
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