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Thomas Eickhoff
Observed name:
T Eickhoff
Institution:
Forschungszentrum Jülich
Observed institutions:
Forschungszentrum Jülich,
RWTH Aachen University
OpenAlex ID:
A5110083737
Color-Sensitive Si-Photodiode Using Porous Silicon Interference Filters
1997
·
Michael Krüger
, Michael Goetz Berger
, et al.
·
Japanese Journal of Applied Physics
·
17
Boron-doped diamond films on silicon studied by Raman and infrared spectroscopies
1990
·
Ken Okano
, Tateki Kurosu
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Diffuse reflectance spectroscopy of powders
1990
·
T Eickhoff
·
Analytica Chimica Acta
·
2
Far-IR studies of moderately doped molecular beam epitaxy grown GaAs on Si(100)
1991
·
Stefan Morley
, Thomas Eickhoff
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
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Works count:
4
Citation count:
21
H-index:
2
I10-index:
1
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