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Serguei An
Observed name:
An, Serguei
Observed institutions:
Nortel (Canada),
Simon Fraser University
OpenAlex ID:
A5110091167
Ionization coefficient measurements in InP by using multiplication noise characteristics of InP/InGaAs separate absorption, grading, charge, and multiplication (SAGCM) avalanche photodiodes (APDs)
1998
·
Serguei An
, W. R. Clark
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
7
Techniques for achieving low leakage current in dry etched InGaAs waveguide PIN detectors
2004
·
Yahong Y. H. Qian
, Serguei An
, et al.
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
3
Modeling and optimization of commercial buried-heterostructure lasers and APD detectors
2004
·
M. Scheer
, J.K. White
, et al.
·
International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
The Zeeman effect on neutral acceptor bound excitons in silicon
1995
·
Serguei An
·
Summit (Simon Fraser University)
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Works count:
5
Citation count:
10
H-index:
2
I10-index:
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