Work

Ionization coefficient measurements in InP by using multiplication noise characteristics of InP/InGaAs separate absorption, grading, charge, and multiplication (SAGCM) avalanche photodiodes (APDs)

Year: 1998

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.304505

Authors: Serguei An, W. R. Clark, M. Jamal Deen, Anthony S. Vetter, M. Svilans

Institutions: Nortel (Canada), Simon Fraser University

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2019012987

FWCI: 6.419

Cites:

Cited by: 7

Related to: 10