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Nicholas M. Atkinson

Observed name: N. M. Atkinson
OpenAlex ID: A5110118251
Layout Technique for Single-Event Transient Mitigation via Pulse Quenching
2011 · Nicholas M. Atkinson, Arthur F. Witulski, et al. · IEEE Transactions on Nuclear Science · 101
Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths
2011 · Jonathan R. Ahlbin, Matthew J. Gadlage, et al. · IEEE Transactions on Device and Materials Reliability · 57
Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS
2011 · Nicholas M. Atkinson, Jonathan R. Ahlbin, et al. · IEEE Transactions on Nuclear Science · 56
On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology
2012 · T. D. Loveless, J. S. Kauppila, et al. · IEEE Transactions on Nuclear Science · 53
Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOS
2011 · Nelson J. Gaspard, Arthur F. Witulski, et al. · IEEE Transactions on Nuclear Science · 37
Influence of N-Well Contact Area on the Pulse Width of Single-Event Transients
2011 · J. R. Ahlbin, N. M. Atkinson, et al. · IEEE Transactions on Nuclear Science · 31
Differential Charge Cancellation (DCC) Layout as an RHBD Technique for Bulk CMOS Differential Circuit Design
2012 · R. W. Blaine, N. M. Atkinson, et al. · IEEE Transactions on Nuclear Science · 29
Effect of Device Variants in 32 nm and 45 nm SOI on SET Pulse Distributions
2013 · J. A. Maharrey, R. C. Quinn, et al. · IEEE Transactions on Nuclear Science · 28
RHBD Bias Circuits Utilizing Sensitive Node Active Charge Cancellation
2011 · R. W. Blaine, S. E. Armstrong, et al. · IEEE Transactions on Nuclear Science · 23
Radiation Hardening of Voltage References Using Chopper Stabilization
2015 · K. J. Shetler, N. M. Atkinson, et al. · IEEE Transactions on Nuclear Science · 20
Impact of logic synthesis on soft error vulnerability using a 90-nm bulk CMOS digital cell library
2011 · Daniel B. Limbrick, Dolores A. Black, et al. · IEEE SoutheastCon · 19
Single-Event Characterization of a 90-nm Bulk CMOS Digital Cell Library
2010 · N. M. Atkinson · 19
The Quad-Path Hardening Technique for Switched-Capacitor Circuits
2013 · Nicholas M. Atkinson, W. Timothy Holman, et al. · IEEE Transactions on Nuclear Science · 9
Effect of multiple-transistor charge collection on SET pulse widths
2010 · J. R. Ahlbin, M. J. Gadlage, et al. · IEEE International Reliability Physics Symposium proceedings · 8
System-level radiation hardening of low-voltage analog/mixed-signal circuits
2013 · N. M. Atkinson · 7
Characterization of Single-Event Transients Of Body-Tied vs. floating-body circuits in 150 nm 3D SOI
2011 · N. J. Gaspard, J. R. Ahlbin, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
A single-event-hardened CMOS operational amplifier design
2011 · Raymond W. Blaine, Nicholas M. Atkinson, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
Works count: 17
Citation count: 499
H-index: 12
I10-index: 12
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