Work

Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths

Year: 2011

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2011.2157506

Authors: Jonathan R. Ahlbin, Matthew J. Gadlage, Nicholas M. Atkinson, Balaji Narasimham, Bharat L. Bhuva, Arthur F. Witulski, W. Timothy Holman, Paul H. Eaton, Lloyd W. Massengill

Institutions: Vanderbilt University, Naval Sea Systems Command, NSWC Crane Division, Broadcom (United States), Albuquerque Public Schools

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Vanderbilt University

OpenAlex ID: W2102290905

FWCI: 3.251

Cites: 11

Cited by: 57

Related to: 10