Author

A. Drouin

Observed names: A Drouin, Alain Drouin
Institution: Soitec (France)
Observed institutions: Soitec (France), IBM (Canada)
OpenAlex ID: A5110175475
2020 · E. Butaud, S. Ballandras, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 69
2019 · S. Ballandras, E. Courjon, et al. · Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS) · 38
2019 · S. Ballandras, E. Courjon, et al. · Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS) · 11
2013 · Y Bogumilowicz, A Abbadie, et al. · Semiconductor Science and Technology · 11
2022 · W. Schwarzenbach, S. Rouchier, et al. · IEEE International Conference on IC Design and Technology (ICICDT) · 7
2022 · N. Daval, A. Drouin, et al. · IEEE Electron Devices Technology & Manufacturing Conference (EDTM) · 7
2023 · F. Allibert, A. Drouin, et al. · IEEE International Ultrasonics Symposium
2023 · A. Drouin, F. Allibert, et al. · IEEE International Symposium on Applications of Ferroelectrics (ISAF)
Works count: 9
Citation count: 149
H-index: 6
I10-index: 4
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