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Peter Clifton

Observed names: P Clifton, P. Clifton, Peter H Clifton, Peter H. Clifton
Observed institutions: King's College London, University of Cambridge, Cameca (France), Ametek (United States), Seagate (United Kingdom), Cameca (United States)
OpenAlex ID: A5110189077
Hadean age for a post-magma-ocean zircon confirmed by atom-probe tomography
2014 · John W. Valley, Aaron J. Cavosie, et al. · Nature Geoscience · 560
Three-dimensional atom probe studies of an InxGa1−xN∕GaN multiple quantum well structure: Assessment of possible indium clustering
2007 · Mark J. Galtrey, Rachel A. Oliver, et al. · Applied Physics Letters · 174
Atom probe tomography today
2007 · Alfred Cerezo, Peter H. Clifton, et al. · Materials Today · 132
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Three-dimensional composition mapping of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si
2010 · Dominique Mangelinck, Khalid Hoummada, et al. · Scripta Materialia · 63
Overview: Recent Progress in Three-Dimensional Atom Probe Instruments and Applications
2007 · Alfred Cerezo, Peter H. Clifton, et al. · Microscopy and Microanalysis · 48
Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe
2008 · P Clifton, T Gribb, et al. · Microscopy and Microanalysis · 43
Impact of surface preparation on nickel–platinum alloy silicide phase formation
2007 · B. Imbert, C. Guichet, et al. · Microelectronic Engineering · 19
Three-dimensional atomic scale analysis of nanostructured materials
2001 · A Cerezo, M Abraham, et al. · Micron · 18
Comprehensive characterization of the structure of Zr-based metallic glasses
2024 · Debdutta Lahiri, K. V. Mani Krishna, et al. · Scientific Reports · 9
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Atom probe extended to AlGaN: three‐dimensional imaging of a Mg‐doped AlGaN/GaN superlattice
2010 · Samantha E. Bennett, Peter H. Clifton, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 6
The symmetry of the 875 meV Ga-related luminescence band in irradiated silicon
1984 · P Clifton, G Davies, et al. · Journal of Physics C Solid State Physics · 6
New Product Announcement – LEAP 6000XR, New Applications, New Performance
2022 · Robert Ulfig, Daniel Lenz, et al. · Microscopy and Microanalysis · 4
Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
2011 · D Larson, D Lawrence, et al. · Microscopy and Microanalysis · 4
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Three-Dimensional Atom Probe Characterisation of III-Nitride Quantum Well Structures
2008 · Mark J Galtrey, Rachel A Oliver, et al. · Springer proceedings in physics · 3
3D Atom Probe Analysis of Quantum Well and Quantum Dot Materials
2007 · A Cerezo, L Chang, et al. · Microscopy and Microanalysis · 2
New Product Announcement – Invizo 6000, New Applications, New Performance
2022 · David A Reinhard, Daniel Lenz, et al. · Microscopy and Microanalysis · 1
Challenges in Atom Probe Tomography Instrumentation and Reconstruction
2021 · David Reinhard, David Larson, et al. · Microscopy and Microanalysis · 1
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Directions in Atom Probe Tomography
2021 · David Larson, Dan Lenz, et al. · Microscopy and Microanalysis · 1
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Geological Applications of Atom Probe Tomography: New Information from Old Rocks
2014 · John W. Valley, Aaron J. Cavosie, et al. · Microscopy and Microanalysis · 1
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Wide Field of View Versus High Spatial Resolution and High Sensitivity – the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals
2023 · Robert Ulfig, Steven Reddy, et al. · Microscopy and Microanalysis
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Expanding the Role of Atom Probe Tomography in Semiconductor Manufacturing and R&D – The Initiation of a Project Between CAMECA Instruments Inc. and imec
2023 · Robert M Ulfig, David A Reinhard, et al. · Microscopy and Microanalysis
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Structural Change of MgNiY Long Period Stacking Order Investigated with Atom Probe
2022 · Chen Yimeng, Katherine Rice, et al. · Microscopy and Microanalysis
Matrix Composition and Fine-scale Structure Analysis of NMC Li-ion Battery Using Atom Probe Tomography
2021 · Yimeng Chen, Peter Clifton, et al. · Microscopy and Microanalysis
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Performance of Ultra-Violet Laser Pulsing with a Wire-Geometry, Moderately Focused Atom Probe System (EIKOS)
2019 · Robert M. Ulfig, Joseph Bunton, et al. · Microscopy and Microanalysis
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Atom Probe Tomography Analysis of Gallium-Nitride-Based Light-Emitting Diodes
2014 · Ty J. Prosa, David P. Olson, et al. · Bulletin of the American Physical Society
Works count: 27
Citation count: 1,095
H-index: 9
I10-index: 8
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