Author

S. M. Noh

Observed names: S M Noh, S. Noh, S.M. Noh

OpenAlex ID: A5111056470

2018 · K. Lee, K. Yamane, et al. · Symposium on VLSI Technology · 37

2016 · J. M. Slaughter, K. Nagel, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 37

2018 · J. H. Lim, N. Raghavan, et al. · IEEE International Reliability Physics Symposium proceedings · 12

2017 · J.M. Slaughter, K. Nagel, et al. · IEEE International Magnetics Conference · 7

2017 · J.H. Lim, N. Raghavan, et al. · Microelectronic Engineering · 6

2016 · J M Slaughter, K Nagel, et al. · IEEE Conference Proceedings

Works count: 6

Citation count: 99

H-index: 5

I10-index: 3