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Ruohong Duan

Institution: Beihang University
Observed institution: Beihang University
ORCID: 0009-0006-3080-196X
Observed ORCID: 0009-0006-3080-196X
OpenAlex ID: A5111281682
Asymmetry Degradation Behavior Under Forward and Backward Overlap Dynamical Stress in Large-Size Amorphous InGaZnO TFT
2024 · Ruohong Duan, Zhixiang Zou, et al. · IEEE Transactions on Electron Devices
Works count: 1
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