Author

Kyeong-Seok Son

Institutions: Samsung (South Korea), Samsung Display (South Korea)

Observed institutions: Samsung (South Korea), Samsung Display (South Korea)

OpenAlex ID: A5111302986

Exceptional Immunity of Drain-Induced Barrier Lowering Effect in a -IGZTO Transistors via Favorable Coupling Effects of Metal-H Bonding

2024 · Gwang-Bok Kim, Se Eun Kim, et al. · IEEE Electron Device Letters · 11

Works count: 1

Citation count: 11

H-index: 1

I10-index: 1