Author

Wojciech J. Walecki

Observed names: W J Walecki, W Walecki, W. J. Wal/ecki, W. J. Walecki, W. Walecki, W. Wałecki, W.J. Walecki, Wojciech J Walecki, Wojciech Walecki

Institution: Miami Dade College

Observed institutions: University of Iowa, IBM (United States), Eastern Illinois University, University of California, Los Angeles, Miami Dade College, Cornell University, Brown University, Massachusetts General Hospital, IBM Research - Thomas J. Watson Research Center, Lambda Science (United States), University of Warsaw, Clemson University

OpenAlex ID: A5111470729

Excitonic enhancement of the Fermi-edge singularity in a dense two-dimensional electron gas

1992 · W. Chen, M. Fritze, et al. · Physical review. B, Condensed matter · 128

Characterization of the polarization state of weak ultrashort coherent signals by dual-channel spectral interferometry

1997 · W. J. Walecki, David N. Fittinghoff, et al. · Optics Letters · 114

Band offsets and exciton confinement in Zn1−yCdySe/Zn1−xMnxSe quantum wells

1990 · W. J. Wal/ecki, A. V. Nurmikko, et al. · Applied Physics Letters · 40

Spectroscopy of CdTe/MnTe single quantum wells: A strained-layer II-VI heterostructure with strong electronic confinement

1990 · N. Pelekanos, Q. Fu, et al. · Physical review. B, Condensed matter · 33

Ultraviolet and blue holographic lithography of ZnSe epilayers and heterostructures with feature size to 100 nm and below

1990 · W. Walecki, W. R. Patterson, et al. · Applied Physics Letters · 24

Temporally and spectrally resolved amplitude and phase of coherent four-wave-mixing emission from GaAs quantum wells

1997 · X. Chen, Wojciech J. Walecki, et al. · Physical review. B, Condensed matter · 23

Measurement of the ultrafast polarization dynamics of weak four-wave mixing signals by dual-channel femtosecond spectral interferometry

1998 · O. Buccafusca, X. Chen, et al. · Journal of the Optical Society of America B · 19

Fast in-line surface topography metrology enabling stress calculation for solar cell manufacturing for throughput in excess of 2000 wafers per hour

2008 · W J Walecki, F Szondy, et al. · Measurement Science and Technology · 18

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Characteristics of thin-film ZnSe/(Zn,Cd)Se/ZnSe heterostructure waveguides in the visible and near infrared

1991 · W. J. Walecki, A. Nurmikko, et al. · Journal of the Optical Society of America B · 18

Low-coherence interferometric absolute distance gauge for study of MEMS structures

2005 · Wojciech J. Walecki, Kevin Lai, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 15

On using the coherent far IR radiation produced by a charged particle bunch to determine its shape — II Measurement with synchrotron and transition radiation

1997 · Gi Schneider, R Lai, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 15

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Terahertz electromagnetic transients as probes of a two-dimensional electron gas

1993 · W. J. Walecki, D. Some, et al. · Applied Physics Letters · 15

Distributed feedback operation of optically pumped ZnSe quantum-well lasers in the blue-green

1992 · T. Ishihara, G. Brunthaler, et al. · Applied Physics Letters · 15

Novel low coherence metrology for nondestructive characterization of high-aspect-ratio microfabricated and micromachined structures

2004 · Wojciech Walecki, Frank Wei, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12

High-speed high-accuracy fiber optic low-coherence interferometry for in situ grinding and etching process monitoring

2006 · Wojciech J. Walecki, Alexander Pravdivtsev, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10

Non-contact fast wafer metrology for ultra-thin patterned wafers mounted on grinding and dicing tapes

2004 · W. Walecki, V. Suchkov, et al. · IEEE/CPMT International Electronics Manufacturing Technology Symposium · 8

Simple Model of a Rolling Water-Filled Bottle on an Inclined Ramp

2015 · Shihao Lin, Naiwen Hu, et al. · The Physics Teacher · 6

Dynamics of the Amplitude, Phase and Polarization State of Coherent Emission from Quantum Wells

1997 · A. L. Smirl, W. J. Walecki, et al. · physica status solidi (b) · 6

Novel Noncontact Thickness Metrology for Partially Transparent and Nontransparent Wafers for Backend Semiconductor Manufacturing

2004 · Wojciech J. Walecki, Vitali Souchkov, et al. · MRS Proceedings · 5

Extreme-ultraviolet source development: a comparison of different concepts

2000 · Guido Schriever, Manfred Rahe, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Low Coherence Interferometric Metrology for Ultra-thin MEMs Structures

2004 · Wojciech Walecki, Frank Wei, et al. · MRS Proceedings · 4

Specular Reflection from Rough Surfaces Revisited

2016 · Kensei Yasuda, Alvin Kim, et al. · The Physics Teacher · 3

Advanced Fringe Analysis Techniques in Circuit Edit

2006 · R.K. Jain, T. Malik, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 3

Synchronized low coherence interferometry for in-situ and ex-situ metrology for semiconductor manufacturing

2005 · Wojciech J. Walecki, Alexander Pravdivtsev, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3

Fiber-optics Low-coherence Integrated Metrology for In-Situ Non-contact Characterization of Wafer Curvature for Wafers Having Non-uniform Substrate and Thin Film Thickness

2005 · Wojciech J. Walecki, Alexander Pravdivtsev, et al. · MRS Proceedings · 3

Works count: 64

Citation count: 556

H-index: 13

I10-index: 15