Author

Don Williams

OpenAlex ID: A5111569983
2018 · Peter D. Burns, Don Williams · Electronic Imaging · 26
2001 · Don Williams, Peter D. Burns · 24
2014 · Don Williams, Peter D. Burns · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 23
2003 · Don Williams, Peter D. Burns · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 23
1999 · Peter D. Burns, Don Williams · 22
2009 · Don Williams, Peter D. Burns, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2007 · Don Williams, Dietmar Wueller, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2008 · Don Williams, Peter D. Burns · Archiving Conference · 12
2007 · Peter D. Burns, Don Williams · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
2007 · Peter D. Burns, Don Williams · Archiving Conference · 11
2020 · Peter D. Burns, Don Williams, et al. · Electronic Imaging · 10
2012 · Don Williams, Peter D. Burns · Archiving Conference · 10
2007 · Don Williams, Peter D. Burns · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2013 · Peter D. Burns, Jonathan B. Phillips, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2016 · Don Williams, Peter D. Burns · Electronic Imaging · 5
2013 · Don Williams, Peter D. Burns · Archiving Conference · 5
2011 · Peter D. Burns, Don Williams · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2010 · Don Williams, Peter D. Burns · Archiving Conference · 5
2003 · Peter D. Burns, Don Williams · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2009 · Don Williams, Peter D. Burns · Archiving Conference · 4
2007 · Eric K. Zeise, D. René Rasmussen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Works count: 50
Citation count: 370
H-index: 12
I10-index: 16
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