Work

A pilot study of digital camera resolution metrology protocols proposed under ISO 12233, edition 2

Year: 2007

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.768204

Authors: Don Williams, Dietmar Wueller, Kevin Matherson, Hideaka Yoshida, Paul Hubel

Institutions: Hewlett-Packard (United States), Olympus (United States)

Language: English

Topic: Image and Video Quality Assessment

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007613616

FWCI: 1.371

Cites:

Cited by: 13

Related to: 10