Author

Donald L. White

Observed names: D. L. White, D.L. White, Don L. White
OpenAlex ID: A5111682270
1962 · A. R. Hutson, Donald L. White · Journal of Applied Physics · 714
1962 · D. L. White · Journal of Applied Physics · 697
1961 · A. R. Hutson, J. H. McFee, et al. · Physical Review Letters · 441
1974 · Donald L. White, Gary N. Taylor · Journal of Applied Physics · 357
1972 · A. W. Warner, D. L. White, et al. · Journal of Applied Physics · 178
1990 · J. E. Bjorkholm, J. Bokor, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 161
1968 · J. T. LaMacchia, D. L. White · Applied Optics · 58
2000 · D. L. White, O. R. Wood · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 52
1966 · D. L. White, Wen-Chung Wang · Physical Review · 45
1970 · D.L. White, M. Feldman · Electronics Letters · 36
1990 · D. W. Berreman, J. H. Bruning, et al. · Optics Letters · 32
1962 · D.L. White · IRE Transactions on Ultrasonic Engineering · 29
1993 · J. B. Murphy, D. L. White, et al. · Applied Optics · 26
1965 · D.L. White, E.T. Handelman, et al. · Proceedings of the IEEE · 25
1991 · G. D. Kubiak, D. A. Tichenor, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 23
1991 · D. M. Tennant, J. E. Bjorkholm, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 23
1990 · D. W. Berreman, J. E. Bjorkholm, et al. · Applied Physics Letters · 20
1990 · Tanya E. Jewell, M. M. Becker, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
1995 · D. L. White, O. R. Wood, et al. · Review of Scientific Instruments · 13
1993 · D. A. Tichenor, G. D. Kubiak, et al. · Applied Optics · 12
1991 · A. A. MacDowell, J. E. Bjorkholm, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 12
1981 · M. Feldman, A. D. White, et al. · Journal of Vacuum Science and Technology · 10
1994 · Daniel A. Tichenor, Glenn D. Kubiak, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
1997 · O. R. Wood, D. L. White, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 8
1965 · Raphael Tsu, Donald L. White · Annals of Physics · 8
Works count: 76
Citation count: 3,119
H-index: 17
I10-index: 22
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