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Soft-x-ray projection lithography: printing of 02-μm features using a 20:1 reduction

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Year: 1990
Type: article
Source: Optics Letters
DOI: 10.1364/ol.15.000529
Authors: D. W. Berreman, J. H. Bruning, J. E. Bjorkholm, L. Eichner, R. R. Freeman, T. E. Jewell, W. M. Mansfield, A. A. MacDowell, M. L. O’Malley, E. L. Raab, W. T. Silfvast, L. H. Szeto, D. M. Tennant, W. K. Waskiewicz, D. L. White, D. L. Windt, O. R. Wood
Institution: AT&T (United States)
Language: English

Topic: Advancements in Photolithography Techniques
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed
OpenAlex ID: W1978143552
FWCI: 11.7
Cites: 7
Cited by: 32
Related to: 10
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