Author

Jiun‐Jye Chang

Observed name: Jiun-Jye Chang

Observed institutions: AU Optronics (Taiwan), National Sun Yat-sen University, National Yang Ming Chiao Tung University, National Tsing Hua University

OpenAlex ID: A5111685447

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

2010 · Te-Chih Chen, Ting-Chang Chang, et al. · Applied Physics Letters · 184

Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

2010 · Chih-Tsung Tsai, Ting-Chang Chang, et al. · Applied Physics Letters · 170

Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition

2010 · Te-Chih Chen, Ting-Chang Chang, et al. · Applied Physics Letters · 106

Twin Thin-Film Transistor Nonvolatile Memory With an Indium–Gallium–Zinc–Oxide Floating Gate

2012 · Min-Feng Hung, Yung-Chun Wu, et al. · IEEE Electron Device Letters · 39

P‐15: Bias Stress Reliability for w/ and w/o Oxide‐passivated IGZO TFTs

2011 · Chun‐Hao Tu, Wei‐Ting Lin, et al. · SID Symposium Digest of Technical Papers · 10

Employ Present Five Masks Amorphous Silicon Thin-Film Transistor Design and Process Flow to Realize 5-in. InGaZnO Active-Matrix Liquid Crystal Display with Improved Stress Stability

2011 · Ming-Chin Hung, Hsia-Tsai Hsiao, et al. · Japanese Journal of Applied Physics · 7

PDF

P.23: Nano‐Si Optical Pixel‐Sensor Array using TFT Technology as Image‐Scan/Fingerprint Panel

2013 · An‐thung Cho, Zao‐Shi Zheng, et al. · SID Symposium Digest of Technical Papers · 6

Electrical Degradation and Recovery of Low-Temperature Polycrystalline Silicon Thin-Film Transistors in Polycrystalline Silicon Plasma Process

2011 · Jiun-Jye Chang, Kuei-Shu Chang-Liao, et al. · IEEE Transactions on Electron Devices · 4

P‐20: An Efficient Method for Improving the Negative‐Bias‐Temperature‐Stress (NBTS) Stability of Amorphous In‐Ga‐Zn‐O TFT

2010 · Chen‐Yi Wu, Chi‐Jui Lin, et al. · SID Symposium Digest of Technical Papers · 4

Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

2012 · Jiun-Jye Chang, Kuei-Shu Chang-Liao, et al. · IEEE Transactions on Electron Devices · 2

Investigation of the gate dielectric oxidation treatment in trench gate power devices

2002 · Ming-Jang Lin, Chorng-Wei Liaw, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 1

Chloride-Sensitivity Improvements By Nitrogen Plasma Immersion Ion Implantation On Samarium Oxide Membrane

2013 · Yu-Ren Ye, Yu-Hsuan Lin, et al. · ECS Meeting Abstracts

PDF

P‐27: An Unplugged Electronic Display

2012 · Chun‐Hao Tu, Kuo‐Sen Kung, et al. · SID Symposium Digest of Technical Papers

P‐191: Embedded Nano‐Si Optical Sensor in TFT‐LCDs Technology and Integrated as Touch‐Input Display

2011 · An‐Thung Cho, Ming‐Hung Chung, et al. · SID Symposium Digest of Technical Papers

Works count: 14

Citation count: 533

H-index: 6

I10-index: 5