Work

Electrical Degradation and Recovery of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors With Various Metal Gate Patterns

Year: 2012

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2012.2219053

Authors: Jiun-Jye Chang, Kuei-Shu Chang-Liao, Chen-Chien Li

Institution: National Tsing Hua University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1996129808

FWCI:

Cites: 18

Cited by: 2

Related to: 10