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H. Wakabayashi

A 1/1.8-inch 6.4MPixel 60 frames/s CMOS Image Sensor with Seamless Mode Change
2006 · S. Yoshihara, M. Kikuchi, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 92
Extreme High-Performance n- and p-MOSFETs Boosted by Dual-Metal/High-k Gate Damascene Process using Top-Cut Dual Stress Liners on (100) Substrates
2007 · S. Mayuzumi, J. Wang, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 19
High-Performance Cu-Interconnects with Novel Seamless Low-k SiOCH Stacks (SEALS) Featured by Compositional Modulation Process for 45nm-Node ULSI Devices
2006 · M. Tagami, H. Ohtake, et al. · Symposium on VLSI Technology · 7
An experimental CMOS photon detector with 0.5e-RMS temporal noise and 15μm pitch active sensor pixels
2017 · T. Nishihara, M. Matsumura, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 4
Noise Analysis of a Serial Multiple Sampling in Back-Illuminated CMOS Image Sensor
2016 · H. Wakabayashi, K. Yamaguchi, et al. · International Conference on Solid State Devices and Materials (SSDM)
Tinv Scaling and Jg Reducing for nMOSFET with HfSix/HfO2 Gate Stack by Interfacial Layer Formation Using Ozone Water Treatment Process
2007 · I. Oshiyama, K. Tai, et al. · International Conference on Solid State Devices and Materials (SSDM)
PMOSFET Vth Modulation Technique using Fluorine Treatment through ALD-TiN Suitable for CMOS Devices
2007 · K. Tai, S. Yamaguchi, et al. · International Conference on Solid State Devices and Materials (SSDM)
CMOS devices SOI and multi-gate devices
2006 · H. Wakabayashi, S. Biesemans · Technical digest - International Electron Devices Meeting/Technical digest
100 MHz, 0.55 mm/sup 2/, 2 mW, 16-b stacked-CMOS multiplier-accumulator
2002 · H. Igura, M. Izumikawa, et al. · Custom Integrated Circuits Conference
Intralevel mix and match lithography for sub-100 nm CMOS devices using the JBX-9300FS point-electron-beam system
2002 · M. Narihiro, H. Wakabayashi, et al. · International Microprocesses and Nanotechnology Conference (MNC)
Uniform Raised-Salicide Technology for High-Performance CMOS Devices
2002 · H. Wakabayashi · IEICE Transactions on Electronics
Works count: 12
Citation count: 122
H-index: 4
I10-index: 2
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