Author

Young Chai Jung

Observed name: Jung, Young Chai

Institution: Samsung Electronics (South Korea)

Observed institutions: University of Seoul, Korea University, Samsung Electronics (South Korea), Sungkyunkwan University

OpenAlex ID: A5111847599

Catalyst-free Growth of Single-Crystal Silicon and Germanium Nanowires

2009 · Byung-Sung Kim, Tae-Woong Koo, et al. · Nano Letters · 98

Temperature-Dependent Characteristics of Cylindrical Gate-All-Around Twin Silicon Nanowire MOSFETs (TSNWFETs)

2007 · Keun Hwi Cho, Sung Dae Suk, et al. · IEEE Electron Device Letters · 28

Extracting Mobility Degradation and Total Series Resistance of Cylindrical Gate-All-Around Silicon Nanowire Field-Effect Transistors

2009 · Luryi Choi, Byoung Hak Hong, et al. · IEEE Electron Device Letters · 14

Possibility of Transport Through a Single Acceptor in a Gate-All-Around Silicon Nanowire PMOSFET

2009 · Byoung Hak Hong, Young Chai Jung, et al. · IEEE Transactions on Nanotechnology · 10

Axial p–n Nanowire Gated Diodes as a Direct Probe of Surface-Dominated Charge Dynamics in Semiconductor Nanomaterials

2011 · Tae Woong Koo, Duk Soo Kim, et al. · The Journal of Physical Chemistry C · 9

Fabrication and Characterization of Sidewall Defined Silicon-on-Insulator Single-Electron Transistor

2008 · Young Chai Jung, Keun Hwi Cho, et al. · IEEE Transactions on Nanotechnology · 8

Temperature dependent transport characteristics of multi-bridge-channel MOSFETs (MBCFETs)

2007 · Young Chai Jung, Dong-Won Kim, et al. · International Semiconductor Device Research Symposium · 2

Experimental Investigations on Ballistic Transport in Multi-Bridged Channel Field Effect Transistors

2011 · Young Chai Jung, Byoung Hak Hong, et al. · Japanese Journal of Applied Physics · 1

Works count: 9

Citation count: 170

H-index: 6

I10-index: 4