Author

Yoshitake Tsuji

Observed name: Y. Tsuji

Observed institution: NEC (Japan)

OpenAlex ID: A5111879223

Document image analysis for generating syntactic structure description

2003 · Y. Tsuji · Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition · 13

Document Recognition System With Layout Structure Generator

1990 · Yoshitake Tsuji, Hiroyuki Kami, et al. · 7

Document Image Analysis For Reading Books

1987 · Yoshitake Tsuji, Jun Tsukumo, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6

Character Image Segmentation

1984 · Yoshitake Tsuji, Ko Asai · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6

Flexible sensitivity inspection with TK-CMI software for criticality-awareness

2008 · Frank A. J. M. Driessen, Jamila Gunawerdana, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Knowledge-based approach for adaptive recognition of drawings

1988 · Shin-ichirou Okazaki, Yoshitake Tsuji · Lecture notes in computer science · 5

Development of advanced mask inspection optics with transmitted and reflected light image acquisition

2007 · Ryoichi Hirano, Riki Ogawa, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

Development of next-generation mask inspection method by using the feature of mask image captured with 199-nm inspection optics

2006 · Yoshitake Tsuji, Nobutaka Kikuiri, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

Development of advanced reticle inspection apparatus for hp 65-nm node device and beyond

2006 · Nobutaka Kikuiri, Shingo Murakami, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

Defect printability analysis by lithographic simulation from high resolution mask images

2009 · George Chen, James N. Wiley, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

Variable sensitivity detection (VSD) technology for screening SRAF nuisance defects

2009 · Kyoji Yamashita, Nobuyuki Harabe, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Mask-LMC: lithographic simulation and defect detection from high-resolution mask images

2009 · George Chen, James N. Wiley, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Knowledge-Based Approach for Adaptive Recognition of Drawings.

1988 · Shin-ichirou Okazaki, Yoshitake Tsuji · Pattern Recognition

Works count: 13

Citation count: 57

H-index: 5

I10-index: 1