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Chih‐Chih Lin

Observed names: C. T. Lin, C.-T. Lin, Chih-Chih Lin
OpenAlex ID: A5111881587
Gate Dielectric Breakdown in A-InGaZnO Thin Film Transistors With Cu Electrodes
2021 · Mao-Chou Tai, Yu-Xuan Wang, et al. · IEEE Electron Device Letters · 13
A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide
2020 · Yu-Xuan Wang, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 11
Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions
2022 · Hong-Yi Tu, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 10
Heterojunction Channels in Oxide Semiconductors for Visible‐Blind Nonvolatile Optoelectronic Memories
2020 · Mao‐Chou Tai, Yu‐Xuan Wang, et al. · Advanced Electronic Materials · 9
Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistors
2020 · Hong-Yi Tu, Ting-Chang Chang, et al. · Journal of Physics D Applied Physics · 6
Interface Defect Shielding of Electron Trapping in a-InGaZnO Thin Film Transistors
2020 · Chih-Chih Lin, Mao-Chou Tai, et al. · IEEE Transactions on Electron Devices · 5
Dynamic switching-induced back-carrier-injection in a-InGaZnO thin film transistors
2020 · Mao-Chou Tai, Yu-Ching Tsao, et al. · Journal of Physics D Applied Physics · 3
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Effect of a-InGaZnO TFT Channel Thickness under Self-Heating Stress
2019 · Mao-Chou Tai, Po-Wen Chang, et al. · ECS Journal of Solid State Science and Technology · 3
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Thermal Field Effect in Resistive Random Access Memory With Sidewall Structures of Different Thermal Conductivity
2022 · Yong-Ci Zhang, Tsung-Ming Tsai, et al. · IEEE Transactions on Electron Devices · 2
Vertical Electric Field-Induced Abnormal Capacitance–Voltage Electrical Characteristics in a-InGaZnO TFTs
2021 · Chuan-Wei Kuo, Ting-Chang Chang, et al. · IEEE Transactions on Electron Devices · 1
Effect of Different a-InGaZnO TFTs' Channel Thickness upon Self-Heating Stress
2019 · Mao-Chou Tai, Po-Wen Chang, et al. · ECS Transactions · 1
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Efficient Transistor Optimization with Stress Enhanced Notch-gate Technology for sub-90nm CMOSFET
2007 · W.-K. Yeh, C.-W Hsu, et al. · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) · 1
Evaluation of Si/SiO2 Interface Properties for CMOS Fabricated on Hybrid Orientation Substrate with Amorphization/Templated Recrystallization Method
2010 · P. C. Huang, S. L. Wu, et al. · International Conference on Solid State Devices and Materials (SSDM)
Dual-pump Double-pass Double-clad Cr4+:YAG Crystal Fiber Broadband ASE Light Source
2009 · K. Y. Hsu, D. Y. Jheng, et al. · Conference on Lasers and Electro-Optics
Temperature Effects on Recrystallization and Improvements of Pure Gadolinium (Gd) Nanocrystal (NC) for Flash Memory
2008 · Y. K. Chen, C. S. Lai, et al. · International Conference on Solid State Devices and Materials (SSDM)
Investigation and Modeling of Stress Interactions on 90 nm SOI CMOS with Various Mobility Enhancement Approaches
2007 · C. T. Lin, Y. K. Fang, et al. · International Conference on Solid State Devices and Materials (SSDM)
The study of blue organic light emitting diodes with a CuPc electron transporting layer
2004 · Chih-Chih Lin, Mou-Zhong Lin, et al. · Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)
Works count: 17
Citation count: 65
H-index: 5
I10-index: 3
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