2009 · Has Tanbakuchi, Matt Richter, et al. · IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS) · 21

Detecting response of microelectromechanical resonators by microwave reflectometry

2013 · B. Legrand, D. Ducatteau, et al. · Applied Physics Letters · 16

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Scanning Microwave Microscopy: Advances in Quantitative Capacitance and Carrier Density Measurements at the Nanometer Scale

2013 · SHIJIE WU, FERRY KIENBERGER, et al. · World Scientific series in nanoscience and nanotechnology/World scientific series in nanoscience and nanotechnology · 9

Semiconductor Material and Device Characterization via Scanning Microwave Microscopy

2013 · Hassan Tanbakuchi, Ferry Kienberger, et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 8

Design of scanning capacitance microscope

2006 · Hassan Tanbakuchi, Matt Richter, et al. · ARFTG Microwave Measurement Conference · 8

Transmission and reflection mode scanning microwave microscopy (SMM): Experiments, calibration, and simulations

2015 · Pablo F. Medina, Andrea Lucibello, et al. · European Microwave Conference (EuMC) · 7

attoF MOS varactor RF measurement VNA coupled with interferometer

2011 · Romain Debroucke, Daniel Gloria, et al. · ARFTG Microwave Measurement Conference · 5

A Broadband Tracking YIG-Tuned Mixer for a State-of-the-Art Spectrum Analyzer

1987 · Hassan Tanbakuchi · European Microwave Conference (EuMC) · 5

Sub-femtoFarad MOS varactor characterization tools

2010 · Romain Debroucke, Jean-François Larchanche, et al. · European Microwave Conference (EuMC) · 4

Quantitative measurement of electric properties on the nanometer scale using atomic force microscopy

2011 · Matthias A. Fenner, Ferry Kienberger, et al. · International Semiconductor Conference Dresden-Grenoble (ISCDG) · 3

Scanning Impedance Probe Microscope

2008 · Hassan Tanbakuchi, Wenhai Han, et al. · IEEE Conference on Nanotechnology (IEEE NANO) · 3

Magnetically tunable oscillators and filters

1989 · H. Tanbakuchi, D. Nicholson, et al. · IEEE International Magnetics Conference · 2

Microwave reflectometry: A high-resolution technique for measuring vibration of capacitive microresonators

2013 · B. Legrand, D. Ducatteau, et al. · International Conference on Solid-State Sensors, Actuators and Microsystems · 1

Characterization of sub-10nm-scale capacitors and tunnel junctions by SMM coupled to RF interferometry

2014 · Wang, Fei, Ducatteau, Damien, et al. · HAL

Système pour détecter des réponses d'un dispositif résonateur micro-électromécanique (MEMS)

2013 · Tanbakuchi, H., Legrand, Bernard, et al. · HAL

Interferometric scanning microwave microscope for nanotechnology application

2013 · Clement, N., Dargent, Thomas, et al. · HAL

Calibrated nanoscale dopant profiling using a scanning microwave microscope. | NIST

2012 · Pavel Kaboš, Thomas M. Wallis, et al. · Review of Scientific Instruments

SOL-like calibrated RF measurements at the nanoscale on a modified scanning microwave microscope

2012 · Dargent, Thomas, Ducatteau, D., et al. · HAL

Works count: 30

Citation count: 611

H-index: 9

I10-index: 9