1994 · J. F. Zheng, X. Liu, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 14

Cross-sectional scanning tunneling microscopy of semiconductor vertical-cavity surface-emitting laser structure

1994 · J. F. Zheng, D. F. Ogletree, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 9

Interface Segregation and Clustering in Strained-Layer InGaAs/GaAs Heterostructures Studied by Cross-Sectional Scanning Tunneling Microscopy

1994 · J. F. Zheng, J. D. Walker, et al. · Physical Review Letters · 7

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Novel optically-controlled optical switch based on intimate integration of surface-normal photodiode and waveguide electroabsorption modulator for wavelength conversion

2004 · H.V. Demir, V.A. Sabnis, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 5

Demonstration of enhancement-mode GaAs metal-insulator-semiconductor field effect transistor with channel inversion using Si3N4 as gate dielectric

2008 · J. F. Zheng, W. Tsai, et al. · Applied Physics Letters · 4

Self-aligned via and trench for metal contact in III-V semiconductor devices

2006 · Jun Fei Zheng, Hilmi Volkan Demir, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 4

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Scanning Tunneling Microscopy of Si Donors in GaAs

1993 · Jun-Fei Zheng, X. Liu, et al. · Materials science forum · 3

MOCVD GST for high speed and low current Phase Change Memory

2011 · J. F. Zheng, P. Chen, et al. · Non-Volatile Memory Technology Symposium · 2

Gate Quality Al2O3 by Molecular-Atomic-Deposition (MAD) and its Potential Applications in III-V Semiconductor CMOS Technology

2007 · Sharon Cui, Ning Li, et al. · ECS Transactions · 2

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The effect of shallow donors and acceptors on AlAs/GaAs superlattices intermixing studied on atomic scale

1995 · J.F Zheng, M Salmeron, et al. · Solid State Communications · 1

Scanning tunneling microscopy of point defects and interfaces in compound semiconductors

1995 · J. F. Zheng, M. Salmeron, et al. · AIP conference proceedings · 1