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Chuck Hawkins
Institution:
University of Florida
Observed institutions:
University of New Mexico,
University of Florida,
National Institute of Astrophysics, Optics and Electronics,
Universitat de les Illes Balears
OpenAlex ID:
A5112856494
Testing of Stuck-Open Faults in Nanometer Technologies
2012
·
Victor Champac
, Julio Vazquez Hernandez
, et al.
·
IEEE Design & Test of Computers
·
13
Stuck-Open Fault Leakage and Testing in Nanometer Technologies
2009
·
Julio Vazquez
, Victor Champac
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
12
User Defined Functions
2003
·
Tony Bain
, Louis Davidson
, et al.
·
Apress eBooks
·
9
LATW2010 - 11th Latin-American Test Workshop
2010
·
Hector Villacorta
, Victor Champac
, et al.
·
conference
·
3
Reliability analysis of small delay defects in vias located in signal paths
2010
·
Hector Villacorta
, Victor Champac
, et al.
·
IEEE Latin American Test Symposium (LATS)
·
3
A modern look at the CMOS stuck-open fault
2009
·
Roberto Gomez
, Victor Champac
, et al.
·
IEEE Latin American Test Symposium (LATS)
·
3
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths
2013
·
Hector Villacorta
, Chuck Hawkins
, et al.
·
IEEE Design and Test
·
2
What Ever Happened to the Famous CMOS Stuck-Open Fault (aka The Memory Fault)?
2006
·
Victor Champac
, Roberto Gomez
, et al.
·
EDFA Technical Articles
The Nature of Nanometer Timing Failures
2005
·
Jaume Segura
, Chuck Hawkins
·
EDFA Technical Articles
Security
2003
·
Tony Bain
, Louis Davidson
, et al.
·
Apress eBooks
Triggers
2003
·
Tony Bain
, Louis Davidson
, et al.
·
Apress eBooks
Introduction
2003
·
Tony Bain
, Louis Davidson
, et al.
·
Apress eBooks
Bridge and Open Circuit Defect Properties
2002
·
Anne Gattiker
, Jerry Soden
, et al.
·
EDFA Technical Articles
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Works count:
14
Citation count:
45
H-index:
3
I10-index:
2
Year
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