Work

Testing of Stuck-Open Faults in Nanometer Technologies

Year: 2012

Type: article

Source: IEEE Design & Test of Computers

DOI: 10.1109/mdt.2012.2205609

Authors: Victor Champac, Julio Vazquez Hernandez, Salvador Barcelo, Roberto Gomez, Chuck Hawkins, Jaume Segura

Institutions: National Institute of Astrophysics, Optics and Electronics, Universidad de Sonora, Universitat de les Illes Balears, University of New Mexico

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Consejo Nacional de Ciencia y Tecnología, Ministerio de Ciencia y Tecnología

OpenAlex ID: W1998374178

FWCI: 3.15

Cites: 24

Cited by: 13

Related to: 10