Author

Yukinori Kuroki

Observed names: Kuroki Yukinori, Yukinori Kuroki Yukinori Kuroki

OpenAlex ID: A5113435772

Detection of Magnetic Nanoparticles with Superconducting Quantum Interference Device (SQUID) Magnetometer and Application to Immunoassays

1999 · Keiji Enpuku, Tadashi Minotani, et al. · Japanese Journal of Applied Physics · 133

Trap assisted leakage current conduction in thin silicon oxynitride films grown by rapid thermal oxidation combined microwave excited plasma nitridation

2003 · Rohana Perera, Akihiro Ikeda, et al. · Microelectronic Engineering · 86

Effects of post annealing on removal of defect states in silicon oxynitride films grown by oxidation of silicon substrates nitrided in inductively coupled nitrogen plasma

2003 · Rohana Perera, Akihiro Ikeda, et al. · Thin Solid Films · 36

High Performance DC Superconducting Quantum Interference Device Utilizing a Bicrystal Junction with a 30° Misorientation Angle

1997 · Tadashi Minotani, Satoru Kawakami, et al. · Japanese Journal of Applied Physics · 30

PDF

Inductively coupled plasma application to the resist ashing

2001 · Ken-ichi Takagi, Akihiro Ikeda, et al. · Thin Solid Films · 21

Properties of Josephson Junction Fabricated on Bicrystal Substrate with Different Misorientation Angles

1998 · Tadashi Minotani, Satoru Kawakami, et al. · Japanese Journal of Applied Physics · 21

PDF

Effect of nitrogen plasma conditions on electrical properties of silicon oxynitrided thin films for flash memory applications

2001 · Akihiro Ikeda, M Abd Elnaby, et al. · Thin Solid Films · 19

Electroless Ni–B plating on SiO2 with 3-aminopropyl-triethoxysilane as a barrier layer against Cu diffusion for through-Si via interconnections in a 3-dimensional multi-chip package

2008 · Akihiro Ikeda, Atsushi Sakamoto, et al. · Thin Solid Films · 16

Proximity Effect Correction by Pattern Modified Stencil Mask in Large-Field Projection Electron-Beam Lithography

1998 · Hideo Kobinata, Hiroshi Yamashita, et al. · Japanese Journal of Applied Physics · 13

Fabrication of Open-Top Microchannel Plate Using Deep X-Ray Exposure Mask Made with Silicon On Insulator Substrate

2003 · Tsuyoshi Fujimura, Akihiro Ikeda, et al. · Japanese Journal of Applied Physics · 9

Mobility change of MOSFETs in a chip-stacked multichip package

2006 · Akihiro Ikeda, Kiyoshi Hamaguchi, et al. · Electronics and Communications in Japan (Part II Electronics) · 8

Oxynitridation of silicon with nitrogen plasma for flash memory applications characterized by high frequency capacitance–voltage measurements

2001 · Akihiro Ikeda, M. Abd Elnaby, et al. · Thin Solid Films · 8

Complementary exposure of 70 nm SoC devices in electron projection lithography

2003 · Hiroshi Yamashita, Isao Amemiya, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6

Observation of On-Chip Electrophoresis Microcapillary Using Confocal Laser Scanning Microscopy

2003 · Shinichi Etoh, Tsuyoshi Fujimura, et al. · Japanese Journal of Applied Physics · 3

Film Density Dependence of Polymethylmethacrylate Ablation under Synchrotron Radiation Irradiation

2001 · Tsuyoshi Fujimura, Yukinori Kuroki, et al. · Japanese Journal of Applied Physics · 3

PDF

Compliant bump technology for back-side illuminated CMOS image sensor

2009 · Tanemasa Asano, Naoya Watanabe, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 2

Electrical passivation of B-doped Si through thin films used in VLSI fabrication

1996 · Keiichi Tsukamoto, Satoru Iwasaki, et al. · Thin Solid Films · 2

A Delay Circuit for Build-Out-Self-Test in 0.18-μm CMOS

2007 · Li Tianmao, Hasimoto Toshifumi, et al. · International Workshop on Electron Devices and Semiconductor Technology (EDST) · 1

Oxynitridation of Si with Nitrogen Plasma for Flash Memory and its High Frequency C-V Characteristics

2014 · Akihiro Ikeda, M. Abd Elnaby, et al.

Through-Si-Via技術による対応バンプの集積化および裏面彩飾CMOSイメージセンサへの応用

2009 · Asano Tanemasa, Naoya Watanabe, et al. · International Conference on Electronics Packaging (ICEP)

Design of a differential delay circuit with 100ps resolution

2008 · Tianmao Li, Yukinori Kuroki, et al. · QIR (Kyushu University Institutional Repository) (Kyushu University)

PDF

A high precision current source circuit by means of switched-capacitor and PLL for BOST

2008 · Tianmao Li, Hiroyuki Tashiro, et al. · Kyushu University Institutional Repository (QIR) (Kyushu University)

PDF

A Frequency Calibration Circuit of a Switched-Capacitor for BOST Current Reference

2008 · Haruki Uchihata, Hiroyuki Tashiro, et al.

チップスタック型マルチチップ実装におけるMOSFETの移動度の変動について(SiP応力解析技術, 先端電子デバイス実装技術と解析・評価技術の最新動向論文)

2005 · Ikeda Akihiro, 池田晃裕, et al. · 電子情報通信学会論文誌. C, エレクトロニクス

Improvement of Charging Characteristics for Weak Coupled Passive RFID

2005 · Norifumi Kanagawa, Yukinori Kuroki · Kyushu Daigaku Daigakuin shisutemu joho kagaku kiyo/Research reports on information science and electrical engineering

Works count: 34

Citation count: 417

H-index: 9

I10-index: 9