Author

S. Serre

Observed names: Sbastien Serre, Serre, S.

Institutions: Centre National de la Recherche Scientifique, Laboratoire d'Astrophysique de Bordeaux, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Observed institutions: Institut de Radioprotection et de Sûreté Nucléaire, Centre National de la Recherche Scientifique, Aix-Marseille Université, Laboratoire d'Astrophysique de Bordeaux, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence, Institut de Recherche sur les Phénomènes Hors Équilibre, Université Montpellier 2

OpenAlex ID: A5113550424

Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs

2012 · J. L. Autran, S. Serre, et al. · IEEE Transactions on Nuclear Science · 49

Real-time Soft-Error testing of 40nm SRAMs

2012 · J.L. Autran, S. Serre, et al. · IEEE International Reliability Physics Symposium proceedings · 42

Ruprecht 147 DANCe

2019 · J. Olivares, H. Bouy, et al. · Astronomy and Astrophysics · 37

Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate

2012 · S. Serre, S. Semikh, et al. · IEEE Transactions on Nuclear Science · 36

Soft-Error Rate of Advanced SRAM Memories: Modeling and Monte Carlo Simulation

2012 · Jean-Luc Autran, Sergey Semikh, et al. · InTech eBooks · 27

Soft errors induced by natural radiation at ground level in floating gate flash memories

2013 · G. Just, J. L. Autran, et al. · IEEE International Reliability Physics Symposium proceedings · 21

2019 · N. Miret-Roig, H. Bouy, et al. · Astronomy and Astrophysics · 16

Optimization Using Monte Carlo Calculations of a Bonner Sphere Spectrometer Extended to High Energies for the Neutron Environments Characterization

2009 · S. Serre, K. Castellani-Coulie, et al. · IEEE Transactions on Nuclear Science · 16

The Plateau de Bure Neutron Monitor: Design, Operation and Monte Carlo Simulation

2012 · S. Semikh, S. Serre, et al. · IEEE Transactions on Nuclear Science · 14

Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation

2006 · T. Merelle, S. Serre, et al. · IEEE Transactions on Nuclear Science · 14

A review of real-time soft-error rate measurements in electronic circuits

2012 · J.L. Autran, D. Munteanu, et al. · IEEE International Reliability Physics Symposium proceedings · 11

GEANT4 analysis of n-Si nuclear reactions from different sources of neutrons and its implication on soft-error rate

2011 · S. Serre, S. Semikh, et al. · European Conference on Radiation and Its Effects on Components and Systems · 3

VizieR Online Data Catalog: IC 4665 DANCe (Miret-Roig+, 2019)

2019 · N. Miret-Roig, H. Bouy, et al. · VizieR Online Data Catalog

VizieR Online Data Catalog: Ruprecht 147 DANCe. I. (Olivares+, 2019)

2019 · Olivares, J., Bouy, H., et al. · HAL

Optimization using Monte Carlo calculations of a Bonner spheres spectrometer extended to high energies for the neutron environments characterization

2008 · S. Serre, K. Castellani-Coulie, et al. · European Conference on Radiation and Its Effects on Components and Systems

Charge sharing study in the case of neutron induced SEU on 130 nm bulk SRAM modeled by 3-D Device Simulation

2005 · T. Merelle, S. Serre, et al. · ESA SP

Works count: 18

Citation count: 286

H-index: 11

I10-index: 11