Work

Soft errors induced by natural radiation at ground level in floating gate flash memories

Year: 2013

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2013.6531992

Authors: G. Just, J. L. Autran, S. Serre, D. Munteanu, S. Sauze, A. Regnier, J. L. Ogier, P. Roche, G. Gasiot

Institutions: Centre National de la Recherche Scientifique, Aix-Marseille Université, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence, STMicroelectronics (France)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2048990404

FWCI: 5.295

Cites: 18

Cited by: 21

Related to: 10