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Keum Hwan Noh
Observed name:
KEUM HWAN NOH
Institution:
SK Hynix (South Korea)
Observed institutions:
SK Group (United States),
Seoul National University,
SK Hynix (South Korea)
OpenAlex ID:
A5113645562
Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories
2019
·
Changbeom Woo
, Myeongwon Lee
, et al.
·
Symposium on VLSI Technology
·
41
Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories
2020
·
Changbeom Woo
, Shinkeun Kim
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
29
Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash Memories
2020
·
Shinkeun Kim
, Haesoo Kim
, et al.
·
IEEE Transactions on Electron Devices
·
18
A highly manufacturable integration technology of 20nm generation 64Gb multi-level NAND flash memory
2011
·
Keun Woo Lee
, Se Kyoung Choi
, et al.
·
13
Abnormal Disturbance Mechanism of Sub-100 nm NAND Flash Memory
2006
·
Seok Jin Joo
, Hea Jong Yang
, et al.
·
Japanese Journal of Applied Physics
·
13
Performance and Reliability of Low-Temperature Processed SrBi[sub 2]Ta[sub 2]O[sub 9] Capacitors for FeRAM Applications
2004
·
Sang-Hyun Oh
, Keum Hwan Noh
, et al.
·
Journal of The Electrochemical Society
·
11
PDF
Ferroelectric Memories using Randomly Oriented (Bi1-xLax)4Ti3O12Films
2003
·
Beelyong Yang
, Seaung Suk Lee
, et al.
·
Japanese Journal of Applied Physics
·
9
PDF
Imprint Characteristics of Ferroelectric Thin Films at Elevated Storage and Operation Temperatures
2002
·
Keum Hwan Noh
, Young Min Kang
, et al.
·
Japanese Journal of Applied Physics
·
7
PDF
Issues and Reliability of High-Density FeRAMs
2003
·
Keum Hwan Noh
, Beelyong Yang
, et al.
·
Japanese Journal of Applied Physics
·
4
Phase coexistence of hyderogen-bonded mixed crystals
2001
·
Sook-Il Kwun
, Keum Hwan Noh
, et al.
·
Ferroelectrics
·
3
Dynamic behavior of deuteron glass Rb0.7(ND4)0.3D2AsO4
1998
·
Keum Hwan Noh
, Sook-Il Kwun
, et al.
·
Physical review. B, Condensed matter
·
3
Using statistical models for optimal packaging in semiconductor manufacturing processes
2024
·
Dongguen Kim
, Heejin Kim
, et al.
·
Journal of the Korean Statistical Society
·
2
Optimization of control gate material and structure for enhancing 20nm 64Gb NAND flash reliability
2012
·
Hae Soo Kim
, Kang Jae Lee
, et al.
·
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
·
2
Study of the anisotropic dielectric behavior of Rb1−x(NH4)xH2PO4 (x=0.15 and 0.17) mixed crystals
2000
·
Keum Hwan Noh
, Sook-Il Kwun
, et al.
·
Physical review. B, Condensed matter
·
2
Retention Characteristics of (Bi, La)4Ti3O12-Based FeRAMs
2004
·
KEUM HWAN NOH
, SEAUNG-SUK LEE
, et al.
·
Integrated ferroelectrics
·
1
Cell Signal Distribution and Imprint Reliability in FeRAM with Hybrid Bit Line Architecture
2003
·
Keum Hwan Noh
, Seaung-Suk Lee
, et al.
·
Integrated ferroelectrics
The Issues and Reliability of High Density FeRAMs
2002
·
Keum Hwan Noh
, Beelyong Yang
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
Slow Dynamics and Out of Equilibrium Behavior in Rb 1− x (ND 4 ) x D 2 AsO 4 Mixed Crystals
2002
·
Sook-Il Kwun
, Keum Hwan Noh
, et al.
·
Ferroelectrics
Physical Properties of Ferroelectric Mixed Crystals
2001
·
SOOK-IL KWUN
, KEUM HWAN NOH
Polarization dynamics of deuteron glass Rb1−x(Nd4)D2AsO4
1999
·
Sook-Il Kwun
, Keum Hwan Noh
, et al.
·
Ferroelectrics
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Works count:
20
Citation count:
158
H-index:
7
I10-index:
6
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