Work

Using statistical models for optimal packaging in semiconductor manufacturing processes

Year: 2024

Type: article

Source: Journal of the Korean Statistical Society

DOI: 10.1007/s42952-024-00284-1

Authors: Dongguen Kim, Heejin Kim, Yejin Kim, Minwoo Chae, Young Myoung Ko, Young-Mok Bae, Hyungsub Sim, Young Chan Oh, Keum Hwan Noh

Institutions: Pohang University of Science and Technology, SK Hynix (South Korea)

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: SK Hynix, Korea Institute for Advancement of Technology, National Research Foundation of Korea

Awards: G1879426595, G2652665704, G4359304099

OpenAlex ID: W4401400296

FWCI: 0.314

Cites: 33

Cited by: 2

Related to: 10