Author

R. W. Carpick

Observed names: R.W. Carpick, Robert W. Carpick, Robert W. Carpick

Observed institutions: University of Wisconsin–Madison, Lawrence Berkeley National Laboratory, Sandia National Laboratories, University of Pennsylvania, University of California, Berkeley

OpenAlex ID: A5113651748

Calibration of frictional forces in atomic force microscopy

1996 · D. F. Ogletree, R. W. Carpick, et al. · Review of Scientific Instruments · 609

A General Equation for Fitting Contact Area and Friction vs Load Measurements

1999 · Robert W. Carpick, D.Frank Ogletree, et al. · Journal of Colloid and Interface Science · 498

Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy

1997 · R. W. Carpick, D. F. Ogletree, et al. · Applied Physics Letters · 434

Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond(111)/Tungsten Carbide Interface

1998 · M. Enachescu, R. J. A. van den Oetelaar, et al. · Physical Review Letters · 196

Observation of proportionality between friction and contact area at the nanometer scale

1999 · M. Enachescu, R.J.A. van den Oetelaar, et al. · Tribology Letters · 130

A variable temperature ultrahigh vacuum atomic force microscope

1995 · Q. Dai, R. Vollmer, et al. · Review of Scientific Instruments · 111

Dynamics of Atomic Stick-Slip Friction Examined with Atomic Force Microscopy and Atomistic Simulations at Overlapping Speeds

2015 · Xin-Z. Liu, Zhijiang Ye, et al. · Physical Review Letters · 100

The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum

2004 · M. Enachescu, R. W. Carpick, et al. · Journal of Applied Physics · 40

Erratum: Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope [J. Vac. Sci. Technol. B 14 , 1289 (1996)]

1996 · R. W. Carpick, N. Agraït, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 10

Directional shear force microscopy

2001 · A. R. Burns, R. W. Carpick · Applied Physics Letters · 7

Nanoscale Characterization of Fault Roughness by Atomic Force Microscopy

2015 · Christopher A. Thom, E. E. Brodsky, et al. · AGUFM · 1

Nanoscale Roughness of Faults Explained by the Scale-Dependent Yield Stress of Geologic Materials

2017 · Christopher A. Thom, E. E. Brodsky, et al. · AGU Fall Meeting Abstracts

The Load and Time Dependence of Chemical Bonding-Induced Frictional Ageing of Silica at the Nanoscale

2015 · Kaiwen Tian, Nitya Nand Gosvami, et al. · AGU Fall Meeting Abstracts

Adhesion and Friction Measurements

2011 · P. L. Piotrowski, R. J. Cannara, et al. · CRC Press eBooks

Works count: 14

Citation count: 2,136

H-index: 9

I10-index: 9