Work

Nanoscale Characterization of Fault Roughness by Atomic Force Microscopy

Year: 2015

Type: article

Source: AGUFM

Authors: Christopher A. Thom, E. E. Brodsky, D. L. Goldsby, Thibault Candela, R. W. Carpick

Language: English

Topic: earthquake and tectonic studies

Subfield: Geophysics

Field: Earth and Planetary Sciences

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2996023967

FWCI:

Cites:

Cited by: 1

Related to: 10