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Kyosuke Kobinata
Observed names:
K. Kobinata,
Kyosuke KOBINATA
Institutions:
Tokyo Institute of Technology,
Disco (japan)
Observed institutions:
Tokyo Institute of Technology,
Chiba University,
Disco (japan),
Murata (Japan)
OpenAlex ID:
A5113863752
Miniaturized 3D Functional Interposer Using Bumpless Chip-on-Wafer (COW) Integration with Capacitors
2021
·
Tatsuya Funaki
, Yoshiaki Satake
, et al.
·
IEEE Electronic Components and Technology Conference (ECTC)
·
19
Functional Interposer Embedded with Multi-Terminal Si Capacitor for 2.5D/3D Applications Using Planarization and Bumpless Chip-on-Wafer (COW)
2022
·
Yoshiaki Satake
, Tatsuya Funaki
, et al.
·
IEEE Electronic Components and Technology Conference (ECTC)
·
12
Low-ESL (<1 pH @ 8.5 GHz) Multi-Terminal Si Capacitor Embedded in 3D Functional Interposer for Power Delivery Network
2022
·
Kyosuke Kobinata
, Tatsuya Funaki
, et al.
·
IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
·
6
Generation of Si@C/SiC@C core–shell nanoparticles by laser irradiation of silicon grinding waste
2022
·
Kanon Minami
, Kyosuke Kobinata
, et al.
·
Nano Select
·
6
Generating Silicon Nanofiber Clusters from Grinding Sludge by Millisecond Pulsed Laser Irradiation
2020
·
Ko Momoki
, Kunimitsu Takahashi
, et al.
·
Nanomaterials
·
6
PDF
Multilayer Graphene-Coated Silicon Carbide Nanowire Formation Under Defocused Laser Irradiation
2023
·
Kanon Minami
, Kyosuke Kobinata
, et al.
·
Nanomanufacturing and Metrology
·
5
PDF
First-principles study of Schottky barrier behavior at Fe3Si/Ge(111) interfaces
2014
·
Kyosuke Kobinata
, Takashi Nakayama
·
Japanese Journal of Applied Physics
·
5
Warpage Control Technology using 300 mm Waffle Wafer Evaluated by High-Precision FEM Analysis
2024
·
Wataru Doi
, Tatsuya Funaki
, et al.
·
International Conference on Electronics Packaging (ICEP)
·
4
Highly Reliable Four-Point Bending Test Using Stealth Dicing Method for Adhesion Evaluation
2019
·
Yi-Lun Yang
, Jia-Ling Liu
, et al.
·
International Conference on Electronics Packaging (ICEP)
·
4
A Study of Efficiency of Total Volume of Mold Resin for Warpage in COW Process
2024
·
Wataru Doi
, Yoshiaki Satake
, et al.
·
International Microsystems, Packaging, Assembly and Circuits Technology Conference
·
2
Precise Warpage Control Technology for 12-Inch Bumpless Via-Last Chip-on-Wafer (COW) by Finite Element Method (FEM)
2023
·
Wataru Doi
, Tatsuya Funaki
, et al.
·
International Microsystems, Packaging, Assembly and Circuits Technology Conference
·
2
Voidless Chip-on-Wafer Process for Functional Interposer
2021
·
Y. Satake
, T. Funaki
, et al.
·
International Conference on Electronics Packaging (ICEP)
·
1
Change in Material Structure upon Laser Irradiation of Mixed Target of Si Grinding Waste and Graphite Powder
2024
·
Kanon MINAMI
, Kyosuke KOBINATA
, et al.
·
Journal of The Japan Society of Electrical Machining Engineers
PDF
Development of Functional Interposer Using Bumpless Chip-on-Wafer - Feasibility Study of Voidless Bonding with Thin Adhesive -
2020
·
Yoshiaki Satake
, Tatsuya Funaki
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
First Principles Study of the Relation between Schottky-barrier Change and Interface Structures at Fe 3 Si/Ge Interfaces
2013
·
Kyosuke Kobinata
·
The Japan Society of Applied Physics
Relation between Schottky-barrier change and structural disorders at metal/(Si,Ge) interfaces : First-principles study
2012
·
Kyosuke Kobinata
, Takashi Nakayama
·
Technical report of IEICE. SDM
Schottky-barrier change by structural disorders at metal/Si interfaces: First-principles study
2011
·
Kyosuke Kobinata
, Takashi Nakayama
·
International Conference on Simulation of Semiconductor Processes and Devices
Schottky-barrier change by structural disorders at metal/Si interfaces: First-principles study
2011
·
Kyosuke Kobinata
, Takashi Nakayama
·
IEICE Technical Report; IEICE Tech. Rep.
Schottky-barrier modulation by segregation layers at metal/Si interfaces: first-principles study on chemical trend
2010
·
Kyosuke Kobinata
, Yusuke Maruta
, et al.
·
IEICE Technical Report; IEICE Tech. Rep.
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Works count:
20
Citation count:
72
H-index:
5
I10-index:
2
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