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Xupeng Han
Observed name:
Han Xupeng
Institutions:
Chinese Academy of Sciences,
China Aerospace Science and Technology Corporation,
Beijing Microelectronics Technology Institute
Observed institutions:
Chinese Academy of Sciences,
China Aerospace Science and Technology Corporation,
University of Jinan,
Beijing Microelectronics Technology Institute
OpenAlex ID:
A5113867201
Single-Event Transient Analysis and Hardening in a 180 nm CMOS Embedded Low-Dropout Regulator
2017
·
Liang Wang
, Xupeng Han
, et al.
·
European Conference on Radiation and Its Effects on Components and Systems
·
8
Experiment and Simulation on Single-Event Transient Effects of the MOS Capacitor in LDO
2019
·
Chenglong Sui
, Liang Wang
, et al.
·
European Conference on Radiation and Its Effects on Components and Systems
·
7
Experiment and Simulation of Transient Ionizing Radiation Hardening in the 0.18μm CMOS LDO
2021
·
Weiyi Cao
, Yuanfu Zhao
, et al.
·
International Conference on Radiation Effects of Electronic Devices (ICREED)
·
5
COVID-19 Classification using CT Scan Images with Resize-MobileNet
2021
·
Xupeng Han
, Yuehui Chen
·
International Conference on Intelligent Computing, Automation and Systems (ICICAS)
·
3
Radiation Effects of a 128Mb NOR Type B4-Flash
2025
·
Anni Cao
, Yuanfu Zhao
, et al.
·
International Conference on Radiation Effects of Electronic Devices (ICREED)
Single event sensitivity analysis of bandgap reference
2018
·
Sui Chenglong
, Han Xupeng
, et al.
·
DOAJ (DOAJ: Directory of Open Access Journals)
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Works count:
6
Citation count:
23
H-index:
3
I10-index:
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