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Author

Kakumu

Institution: Toshiba (Japan)
Observed institution: Toshiba (Japan)
OpenAlex ID: A5113938312
Design Methodology Of Deep Submicron CMOS Devices For 1V Operation
1993 · Oyamatsu, Kinugawa, et al. · Symposium on VLSI Technology · 31
New CMOS shallow junction well FET structure (CMOS-SJET) for low power-supply voltage
1992 · Yoshimura, Matsuoka, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 16
High-reliability and high-speed design of 1Mb CMOS SRAM with 0.5/spl mu/m devices
1989 · Hayakawa, Kakumu, et al. · Symposium on VLSI Circuits · 1
Works count: 3
Citation count: 48
H-index: 2
I10-index: 2
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