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F. Kezzoula
Observed names:
F Kezzoula,
F. KEZZOULA,
Fouzi Kezzoula,
Kezzoula, F.
Institution:
Centre de Recherche en Technologie des Semi-conducteurs pour l’Energétique
Observed institutions:
University of Boumerdes,
Centre de Recherche en Technologie des Semi-conducteurs pour l’Energétique
OpenAlex ID:
A5114066141
Effect of Er3+ doping on structural, morphological and photocatalytical properties of ZnO thin films
2018
·
S Bouhouche
, F Bensouici
, et al.
·
Materials Research Express
·
28
PDF
Aluminium-induced crystallization of amorphous silicon films deposited by DC magnetron sputtering on glasses
2011
·
F. Kezzoula
, A. Hammouda
, et al.
·
Applied Surface Science
·
21
Effect of Er doping on the microstructural, optical, and photocatalytic activity of TiO2 thin films
2018
·
A Aouina
, F Bensouici
, et al.
·
Materials Research Express
·
15
PDF
Impact of porous SiC-doped PVA based LDS layer on electrical parameters of Si solar cells
2018
·
S. Kaci
, R. Rahmoune
, et al.
·
Optical Materials
·
13
Study of Optical Properties of Nanocrystalline Zinc Phosphide Thin films
2018
·
C. Bouzara
, S. Kaci
, et al.
·
Silicon
·
10
Photoelectrochemical conversion of CO2 using nanostructured PbS–Si Photocathode
2022
·
L. Allad
, D. Allam
, et al.
·
Journal of Applied Electrochemistry
·
9
Effect of fluoric acid concentration on the structural, optical, and photocatalytic properties of TiO2 thin films
2023
·
Abdelaziz Abboudi
, Sabrina Iaiche
, et al.
·
Inorganic Chemistry Communications
·
8
Lithium diffusion profile onto highly resistive p-type silicon
2006
·
A. Keffous
, T. Hadjersi
, et al.
·
Vacuum
·
7
STRUCTURAL AND OPTICAL PROPERTIES OF POLYCRYSTALLINE 6H-SiC AND CRYSTALLINE SiC FILM GROWN ONTO SILICON SUBSTRATE BY PLD
2008
·
A. KEFFOUS
, K. BOURENANE
, et al.
·
Modern Physics Letters B
·
5
Lithium-drifted, silicon radiation detectors for harsh radiation environments
2008
·
J. Grant
, C. Buttar
, et al.
·
Journal of Materials Science Materials in Electronics
·
3
Improving the Texturization of n-Type c-Si Absorbers using Sodium Hypochlorite (NaOCl) as an Additional Component in the Standard Solution Containing a Mixture of IPA and KOH
2024
·
A. Trad Khodja
, F. Kezzoula
, et al.
·
Semiconductors
·
1
Lithium-drifted silicon for harsh radiation environments
2008
·
J. Grant
, C. Buttar
, et al.
·
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
·
1
Investigations on PbS/SiPY-Based Photocathode for Photoelectrochemical Reduction of CO2
2024
·
K. Benfadel
, L. Talbi
, et al.
·
Russian Journal of Electrochemistry
Surface Passivation by Amorphous Silicon a-Si: H Thin Film in Presence of the SiNx: H Layer
2014
·
Kezzoula, F.
, Mohammed-Brahim, Tayeb
, et al.
·
HAL
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Works count:
14
Citation count:
121
H-index:
7
I10-index:
5
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