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C. M. Hsieh

Observed names: C-M. Hsieh, C.-M. Hsieh, C.M. Hsieh
OpenAlex ID: A5114068865
A field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices
1981 · C.M. Hsieh, P.C. Murley, et al. · IEEE Electron Device Letters · 326
Dynamics of Charge Collection from Alpha-Particle Tracks in Integrated Circuits
1981 · C. M. Hsieh, P. C. Murley, et al. · IEEE International Reliability Physics Symposium proceedings · 87
Gettering rates of various fast-diffusing metal impurities at ion-damaged layers on silicon
1972 · T.M. Buck, K.A. Pickar, et al. · Applied Physics Letters · 86
A rutherford scattering study of the diffusion of heavy metal impurities in silicon to ion-damaged surface layers
1973 · T.M. Buck, J.M. Poate, et al. · Surface Science · 47
The Removal of Airborne Molecular Contamination in Cleanroom Using PTFE and Chemical Filters
2004 · C.-F. Yeh, C.-W. Hsiao, et al. · IEEE Transactions on Semiconductor Manufacturing · 35
Nucleation and growth of stacking faults in epitaxial silicon during thermal oxidation
1973 · C. M. Hsieh, D. M. Maher · Journal of Applied Physics · 35
Ion-implantation-damage gettering effect in silicon photodiode array camera target
1973 · C.M. Hsieh, J.R. Mathews, et al. · Applied Physics Letters · 33
Two-dimensional process modeling: A description of the SAFEPRO program
1985 · R. R. O'Brien, C. M. Hsieh, et al. · IBM Journal of Research and Development · 22
Schottky-collector vertical PNM bipolar transistor
1992 · S. Akbar, S. Ratanaphanyarat, et al. · Electronics Letters · 12
Floating body effects in partially-depleted SOI CMOS circuits
1996 · P.-F. Lu, Jackie Ji, et al. · International Symposium on Low Power Electronics and Design (ISLPED) · 9
Mechanistic studies of hydrophilic wafer bonding and Si exfoliation for SOI fabrication
2002 · M.K. Weldon, V. Marsico, et al. · IEEE International SOI Conference (SOI) · 3
Comparative materials characterization of SOI wafers produced by competing technologies
2002 · D. Feijoo, A.P. Mills, et al. · IEEE International SOI Conference (SOI) · 2
Mechanism of silicon exfoliation by hydrogen implantation and He, Li and Si co-implantation [SOI technology]
2002 · M.K. Weldon, V.E. Marsico, et al. · IEEE International SOI Conference (SOI) · 2
Observations of Defect Generation at Stacking Faults in Boron Diffused and Oxidized Silicon Films
1973 · A. G. Cullis, D. M. Maher, et al. · Proceedings annual meeting Electron Microscopy Society of America · 2
Degradation of breakdown voltage of DMOS due to arsenic implant damage
2002 · M.A. Shibib, J.M. Siket, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 1
Mechanism of Silicon Exfoliation by Hydrogen Implantation and He, Li and Si CO-implantation
1997 · M. K. Weldon, Vittorio Marsico, et al. · Repository of the University of Namur · 1
Diffusion of Boron from Polysilicon at High Concentrations
1984 · R. F. Lever, B. Garben, et al. · MRS Proceedings · 1
The role of hydrogen in silicon wafer bonding: an infrared study
2002 · M.K. Weldon, Y.J. Chabal, et al. · IEEE International SOI Conference (SOI)
Works count: 18
Citation count: 704
H-index: 9
I10-index: 9
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