Author

Adam M. Conway

Observed names: A Conway, A M Conway, A. Conway, A. M. CONWAY, A. M. Conway, A.M. Conway, Adam Conway, Conway, Adam; Beck, Patrick R; Graff, Robert T; Nelson, Art; Nikolic, Rebecca J; Payne, Stephen A; Voss, Lars; Kim, Hadong, Conway, Adam; Bora, Mihail; Grivickas, Paulius Vytautas; Voss, Lars, Conway, Adam; Harrison, Sara Elizabeth; Nikolic, Rebecca J.; Shao, Qinghui; Voss, Lars, Conway, Adam; Harrison, Sara Elizabeth; Nikolic, Rebecca J.; Shao, Qinghui; Voss, Lars; Chowdhury, Srabanti
Institution: RTX (United States)
OpenAlex ID: A5114074532
2005 · J.S. Moon, Shihchang Wu, et al. · IEEE Electron Device Letters · 143
2008 · R. J. Nikolić, A. M. Conway, et al. · Applied Physics Letters · 88
2023 · Sudip K. Mazumder, Lars F. Voss, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 85
2013 · Q. Shao, L. F. Voss, et al. · Applied Physics Letters · 61
2020 · David L. Hall, Lars F. Voss, et al. · IEEE Electron Device Letters · 40
2009 · Adam M. Conway, Tzu F. Wang, et al. · IEEE Transactions on Nuclear Science · 39
2007 · A.M. Conway, M. Chen, et al. · IEEE International Reliability Physics Symposium proceedings · 34
2019 · Mihail Bora, Lars F. Voss, et al. · IEEE Electron Device Letters · 30
2013 · A. M. Conway, L. F. Voss, et al. · IEEE Transactions on Nuclear Science · 28
2007 · Rebecca J. Nikolic, Adam M. Conway, et al. · 2006 IEEE Nuclear Science Symposium Conference Record · 27
2020 · S. Rakheja, L. Huang, et al. · IEEE Journal of the Electron Devices Society · 23
2008 · A.J. Nelson, A.M. Conway, et al. · Materials Letters · 18
2005 · Adam M. Conway, Yu Zhao, et al. · IEEE MTT-S International Microwave Symposium digest · 17
2020 · P. Grivickas, P. Ščajev, et al. · Applied Physics Letters · 15
2010 · L. F. Voss, C. E. Reinhardt, et al. · Journal of Electronic Materials · 14
2008 · Krishna C. Mandal, Alket Mertiri, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
2021 · W. Milestone, D. Guo, et al. · Journal of Applied Physics · 13
2011 · R. J. Nikolic, Q. Shao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2021 · Karen Dowling, Yicong Dong, et al. · IEEE Transactions on Electron Devices · 12
2013 · Lars F. Voss, Qinghui Shao, et al. · IEEE Electron Device Letters · 12
2011 · A. M. Conway, L. F. Voss, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12
Works count: 92
Citation count: 1,084
H-index: 16
I10-index: 30
Year
Topic
Type