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Author

Sam Subramanian

Institution: NXP (United States)
Observed institution: NXP (United States)
OpenAlex ID: A5153673735
Advanced FIB/SEM Sample Preparation and Analysis Techniques (2026 Update)
2026 · Sam Subramanian, Khiem Ly, et al. · Proceedings - International Symposium for Testing and Failure Analysis
Works count: 1
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