Author

M. L. POLIGNANO

OpenAlex ID: A5155779263

Chatacterization of nitrided silicon-silicon dioxide interfaces

2000 · M. L. POLIGNANO, M. ALESSANDRI, et al. · AIRUS

Characterization of a Semiconductor-dielectric interface by photocurrent measurements

2000 · M. L. POLIGNANO, D. CAPUTO, et al. · AIRUS

Ultra-thin NO/N2O oxynitride dielectric for advanced flash memory applications: single wafer and batch technology

1999 · B. CRIVELLI, R. ZONCA, et al. · AIRUS

Nitridation by NO or by N2O of Si-SiO2 interfaces of oxide grown in dry or wet ambients

1999 · CARICATO, Anna Paola, F. CAZZANIGA, et al. · AIRUS

Works count: 4

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