Get started
Concept

Built-in self-test

OpenAlex ID: C2780980493
Built-in test for VLSI: Pseudorandom techniques
1989 · Integration · 859
A distributed BIST control scheme for complex VLSI devices
2002 · Y. Zorian · IEEE VLSI Test Symposium (VTS) · 526
Built-In Self-Test Techniques
1985 · Edward McCluskey · IEEE Design & Test of Computers · 414
Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
1995 · S. Hellebrand, J. Rajski, et al. · IEEE Transactions on Computers · 394
Design of Totally Self-Checking Check Circuits for m-Out-of-n Codes
1973 · D.A. Anderson, G. Metze · IEEE Transactions on Computers · 378
Cellular automata-based pseudorandom number generators for built-in self-test
1989 · P.D. Hortensius, R.D. McLeod, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 351
Minimized power consumption for scan-based BIST
2003 · S. Gerstendorfer, H.-J. Wunderlich · IEEE International Test Conference (ITC) · 300
A tutorial introduction to research on analog and mixed-signal circuit testing
1998 · L.S. Milor · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 281
Logic BIST for large industrial designs: real issues and case studies
2003 · G. Hetherington, T. Fryars, et al. · IEEE International Test Conference (ITC) · 275
A tutorial on built-in self-test. I. Principles
1993 · V.D. Agrawal, C.R. Kime, et al. · IEEE Design & Test of Computers · 261
On-Line Testing for VLSI—A Compendium of Approaches
1998 · M. Nicolaidis, Y. Zorian · Journal of Electronic Testing · 250
FRITS - a microprocessor functional BIST method
2003 · P. Parvathala, K. Maneparambil, et al. · IEEE International Test Conference (ITC) · 234
Software-based self-testing methodology for processor cores
2001 · Li Chen, S. Dey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 229
Bit-flipping BIST
2002 · H.-J. Wunderlich, G. Kiefer · International Conference on Computer Aided Design · 228
A Designer’s Guide to Built-In Self-Test
2002 · Stroud, Charles E · Kluwer Academic Publishers eBooks · 227
Software-Based Self-Testing of Embedded Processors
2005 · N. Kranitis, A. Paschalis, et al. · IEEE Transactions on Computers · 194
Built in self repair for embedded high density SRAM
2002 · Ilyoung Kim, Y. Zorian, et al. · IEEE International Test Conference (ITC) · 193
A tutorial on built-in self-test. 2. Applications
1993 · V.D. Agrawal, C.R. Kime, et al. · IEEE Design & Test of Computers · 185
Altering a pseudo-random bit sequence for scan-based BIST
2002 · N.A. Touba, E.J. McCluskey · IEEE International Test Conference (ITC) · 184
Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test
1983 · E. B. Eichelberger, E. Lindbloom · IBM Journal of Research and Development · 180
Testing of Quantum Cellular Automata
2004 · M.B. Tahoori, J. Huang, et al. · IEEE Transactions on Nanotechnology · 178
On low-capture-power test generation for scan testing
2005 · Xiaoqing Wen, Y. Yamashita, et al. · IEEE VLSI Test Symposium (VTS) · 165
Pseudorandom Testing
1987 · Wagner, Chin, et al. · IEEE Transactions on Computers · 165
Reducing test data volume using LFSR reseeding with seed compression
2003 · C.V. Krishna, N.A. Touba · IEEE International Test Conference (ITC) · 163
A BIST scheme for an SNR test of a sigma-delta ADC
2002 · M.F. Toner, G.W. Roberts · IEEE International Test Conference (ITC) · 163
Works count: 6,215
Citation count: 57,200
Year
Topic
Type