Work

A Designer’s Guide to Built-In Self-Test

Year: 2002

Type: book

Source: Kluwer Academic Publishers eBooks

DOI: 10.1007/b117480

Author: Stroud, Charles E

Institution: University of North Carolina at Charlotte

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, University of Kentucky, Defense Advanced Research Projects Agency, University of Illinois at Urbana-Champaign, U.S. Air Force, University of Illinois at Chicago, Advanced Research Projects Agency

OpenAlex ID: W53227076

FWCI: 4.568

Cites:

Cited by: 227

Related to: 10